Use of Near Edge X-ray Absorption Fine Structure Spectromicroscopy to Characterize Multicomponent Polymeric Systems
Applied Spectroscopy, Vol. 55, Issue 12, pp. 1676-1681 (2001)
Acrobat PDF (383 KB)
Abstract
The merits of a polymer characterization technique, near edge X-ray absorption fine structure (NEXAFS) spectromicroscopy, are demonstrated through the characterization of a multilayer polymer film with partially unknown chemical composition. The combination of chemical speciation through NEXAFS spectroscopy with the high spatial resolution available in X-ray microscopy allows the characterization of polymeric materials not possible with conventional techniques. Analysis of a multilayer with layers as thin as 4 μm has yielded results that differ from those previously obtained by infrared microscopy. Layers below the spatial resolution limit of infrared microscopy were characterized.
Citation
A. P. Smith, S. G. Urquhart, D. A. Winesett, G. Mitchell, and H. Ade, "Use of Near Edge X-ray Absorption Fine Structure Spectromicroscopy to Characterize Multicomponent Polymeric Systems," Appl. Spectrosc. 55, 1676-1681 (2001)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-55-12-1676
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
« Previous Article | Next Article »
OSA is a member of 