The merits of a polymer characterization technique, near edge X-ray absorption fine structure (NEXAFS) spectromicroscopy, are demonstrated through the characterization of a multilayer polymer film with partially unknown chemical composition. The combination of chemical speciation through NEXAFS spectroscopy with the high spatial resolution available in X-ray microscopy allows the characterization of polymeric materials not possible with conventional techniques. Analysis of a multilayer with layers as thin as 4 μm has yielded results that differ from those previously obtained by infrared microscopy. Layers below the spatial resolution limit of infrared microscopy were characterized.
A. P. Smith, S. G. Urquhart, D. A. Winesett, G. Mitchell, and H. Ade, "Use of Near Edge X-ray Absorption Fine Structure Spectromicroscopy to Characterize Multicomponent Polymeric Systems," Appl. Spectrosc. 55, 1676-1681 (2001)