Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 57,
  • Issue 1,
  • pp. 80-87
  • (2003)

Use of the Orthogonal Projection Approach (OPA) to Monitor Batch Processes

Not Accessible

Your library or personal account may give you access

Abstract

The orthogonal projection approach (OPA) and multivariate curve resolution (MCR) are presented as a way to monitor batch processes using spectroscopic data. Curve resolution allows one to look within a batch and predict on-line real concentration profiles of the different species appearing during reactions. Taking into account the variations of the process by using an augmented matrix of complete batches, the procedure explained here calculates some prediction coefficients that can afterwards be applied for a new batch.

PDF Article
More Like This
Fast lithographic source optimization using a batch-processing sequential least square estimator

Xu Ma, Haijun Lin, Guoli Jiao, Yanqiu Li, and Gonzalo R. Arce
Appl. Opt. 56(21) 5903-5913 (2017)

Glass-batch composition monitoring by laser-induced breakdown spectroscopy

Bansi Lal, Fang-Yu Yueh, and Jagdish P. Singh
Appl. Opt. 44(18) 3668-3674 (2005)

Real-time batch processing at a GPU-based edge with a passive optical network

Yukito Onodera, Yoshiaki Inoue, Daisuke Hisano, Naoto Yoshimoto, and Yu Nakayama
J. Opt. Commun. Netw. 15(7) 404-414 (2023)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.