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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 57, Iss. 10 — Oct. 1, 2003
  • pp: 1250–1253

Fourier Transform Infrared Synchrotron Ellipsometry for Studying the Anisotropy of Small Organic Samples

K. Hinrichs, M. Gensch, A. Röseler, E. H. Korte, K. Sahre, K.-J. Eichhorn, N. Esser, and U. Schade

Applied Spectroscopy, Vol. 57, Issue 10, pp. 1250-1253 (2003)


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Abstract

An experimental setup for polarization-dependent and spectroscopic ellipsometric measurements was developed that utilizes the brilliance of synchrotron infrared radiation at the electron storage ring at BESSY II for investigations of small samples and sample areas. During commissioning of the beamline and the experimental setup, a 1 mm2 piece of a well-characterized polyimide film was studied to show the benefits of Fourier transform infrared (FT-IR) synchrotron ellipsometry. The band shapes are interpreted with respect to the anisotropic distribution of transition dipole moments within the film. In comparison to a globar source, the signal intensity has been improved by more than one order of magnitude for this example.

Citation
K. Hinrichs, M. Gensch, A. Röseler, E. H. Korte, K. Sahre, K.-J. Eichhorn, N. Esser, and U. Schade, "Fourier Transform Infrared Synchrotron Ellipsometry for Studying the Anisotropy of Small Organic Samples," Appl. Spectrosc. 57, 1250-1253 (2003)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-57-10-1250

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