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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 62, Iss. 11 — Nov. 1, 2008
  • pp: 1180–1188

Raman Mapping Using Advanced Line-Scanning Systems: Geological Applications

Sylvain Bernard, Olivier Beyssac, and Karim Benzerara

Applied Spectroscopy, Vol. 62, Issue 11, pp. 1180-1188 (2008)


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Abstract

By allowing nondestructive chemical and structural imaging of heterogeneous samples with a micrometer spatial resolution, Raman mapping offers unique capabilities for assessing the spatial distribution of both mineral and organic phases within geological samples. Recently developed line-scanning Raman mapping techniques have made it possible to acquire Raman maps over large, millimeter-sized, zones of interest owing to a drastic decrease of the data acquisition time without losing spatial or spectral resolution. The synchronization of charge-coupled device (CCD) measurements with x,y motorized stage displacement has allowed dynamic line-scanning Raman mapping to be even more efficient: total acquisition time may be reduced by a factor higher than 100 compared to point-by-point mapping. Using two chemically and texturally complex geological samples, a fossil megaspore in a metamorphic rock and aragonite-garnet intergrowths in an Eclogitic marble, we compare here two recent versions of line-scanning Raman mapping systems and discuss their respective advantages and disadvantages in terms of acquisition time, image quality, spatial and imaging resolutions, and signal-to-noise ratio. We show that line-scanning Raman mapping techniques are particularly suitable for the characterization of such samples, which are representative of the general complexity of geological samples.

Citation
Sylvain Bernard, Olivier Beyssac, and Karim Benzerara, "Raman Mapping Using Advanced Line-Scanning Systems: Geological Applications," Appl. Spectrosc. 62, 1180-1188 (2008)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-62-11-1180


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