Abstract
The polarized Fourier transform infrared–attenuated total reflection (FT-IR-ATR) technique is a very useful infrared spectroscopic method for characterizing the three-dimensional orientation of thick samples, to which the conventional transmission FT-IR method cannot easily be applied. To quantitatively analyze polarized FT-IR-ATR spectra, the dependence of the optical contact between the sample and the ATR crystal during the clamping and reclamping processes must be controlled. In this work, a new multiple peak reference (MPR) method is proposed and used to carry out a three-dimensional analysis of a poly(trimethylene 2,6-naphthalate) (PTN) polymer sample. The conventional single peak reference (SPR) analysis technique cannot be applied to such a sample due to the lack of an established reference peak. A new artificial reference band was generated by the MPR method using two different infrared bands, at 1602 cm<sup>−1</sup> and 917 cm<sup>−1</sup>, in identical spectra with a combination constant of 0.95. The new artificial reference band was successfully used to calculate the three-dimensional orientation of various infrared bands of a uniaxially drawn PTN film, which has not previously been studied by three-dimensional orientation analyses using the polarized FT-IR-ATR method.
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Add to BibSonomy