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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 62,
  • Issue 2,
  • pp. 171-175
  • (2008)

Anisotropy Studied by Polarization-Modulated Fourier Transform Infrared Reflection Difference Microspectroscopy

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Abstract

We investigated anisotropic optical behavior in solid-state materials using Fourier transform infrared reflection microspectroscopy in combination with polarization modulation. For a Ca<sub>1.8</sub>Sr<sub>0.2</sub>RuO<sub>4</sub> crystal with an isotropic optical surface, we found the reflection difference to be very close to zero, independent of the azimuthal angle of the sample. A Ca<sub>1.4</sub>Sr<sub>0.6</sub>RuO<sub>4</sub> crystal with an anisotropic optical surface, however, exhibited a large anisotropic optical response with a strong angular dependence following a sinusoidal behavior. Furthermore, we examined the spatial distribution of the reflection difference in Bi<sub>0.17</sub>Ca<sub>0.83</sub>MnO<sub>3+δ</sub> using infrared synchrotron radiation and could clearly distinguish microscopic anisotropic domains having different optical axes. These results demonstrate that our experimental scheme can be used as a powerful tool to spectrally and spatially resolve anisotropy of solid-state materials in the mid-infrared region.

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