OSA's Digital Library

Applied Spectroscopy

Applied Spectroscopy

| PUBLISHED BY SAS — AVAILABLE FROM SAS AND OSA

  • Vol. 64, Iss. 3 — Mar. 1, 2010
  • pp: 298–303

Evaporation and Condensation of SiO and SiO2 Studied by Infrared Spectroscopy

M. Klevenz, S. Wetzel, M. Möller, and A. Pucci

Applied Spectroscopy, Vol. 64, Issue 3, pp. 298-303 (2010)


View Full Text Article

Acrobat PDF (394 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations
  • Export Citation/Save Click for help

Abstract

Physical evaporation of SiO and SiO2 under ultra-high vacuum conditions was monitored in situ with infrared spectroscopy at frequencies between 450 cm−1 and 5000 cm−1. The measured vibrational spectra of the condensed films are identical in both cases, for SiO and SiO2 evaporation, and can be described with four Brendel oscillators located at 380 cm−1, 713 cm−1, 982 cm−1, and 1101 cm−1, corresponding to typical vibration modes in SiO.

Citation
M. Klevenz, S. Wetzel, M. Möller, and A. Pucci, "Evaporation and Condensation of SiO and SiO2 Studied by Infrared Spectroscopy," Appl. Spectrosc. 64, 298-303 (2010)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-64-3-298

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited