Physical evaporation of SiO and SiO<sub>2</sub> under ultra-high vacuum conditions was monitored <i>in situ</i> with infrared spectroscopy at frequencies between 450 cm<sup>−1</sup> and 5000 cm<sup>−1</sup>. The measured vibrational spectra of the condensed films are identical in both cases, for SiO and SiO<sub>2</sub> evaporation, and can be described with four Brendel oscillators located at 380 cm<sup>−1</sup>, 713 cm<sup>−1</sup>, 982 cm<sup>−1</sup>, and 1101 cm<sup>−1</sup>, corresponding to typical vibration modes in SiO.
M. Klevenz, S. Wetzel, M. Möller, and A. Pucci, "Evaporation and Condensation of SiO and SiO2 Studied by Infrared Spectroscopy," Appl. Spectrosc. 64, 298-303 (2010)
References are not available for this paper.
OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.