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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 66, Iss. 2 — Feb. 1, 2012
  • pp: 188–197

Effects of Metallic, Semiconducting, and Insulating Substrates on the Coupling Involving Radiative Polaritons in Thin Oxide Films

ANITA J VINCENT-JOHNSON, KYLE A VASQUEZ, GIOVANNA SCAREL, JAMES S HAMMONDS, and MATHIEU FRANCOEUR

Applied Spectroscopy, Vol. 66, Issue 2, pp. 188-197 (2012)


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Abstract

Through simulations, this work explores the effects of conducting, semiconducting, and insulating substrates on the absorption of infrared radiation by radiative polaritons in oxide layers with thicknesses that range from 30 nm to 9 μm. Using atomic layer deposition, oxide layers can be formed in the nanometer scale. Our results suggest that the chemistry and conductivity of the substrate determine the amount of absorption by radiative polaritons in oxide layers thinner than the skin depth. The effects of the chemistry and conductivity of the substrate are especially effective for oxide films thinner than about 250 nm, which we label as the substrate sensitive thickness of the oxide film.

Citation
ANITA J VINCENT-JOHNSON, KYLE A VASQUEZ, GIOVANNA SCAREL, JAMES S HAMMONDS, and MATHIEU FRANCOEUR, "Effects of Metallic, Semiconducting, and Insulating Substrates on the Coupling Involving Radiative Polaritons in Thin Oxide Films," Appl. Spectrosc. 66, 188-197 (2012)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-66-2-188


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