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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 66, Iss. 8 — Aug. 1, 2012
  • pp: 983–986

Comparative Investigation of Fourier Transform Infrared (FT-IR) Spectroscopy and X-ray Diffraction (XRD) in the Determination of Cotton Fiber Crystallinity

Yongliang Liu, Devron Thibodeaux, Gary Gamble, Philip Bauer, and Don VanDerveer

Applied Spectroscopy, Vol. 66, Issue 8, pp. 983-986 (2012)


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Abstract

Despite considerable efforts in developing curve-fitting protocols to evaluate the crystallinity index (CI) from X-ray diffraction (XRD) measurements, in its present state XRD can only provide a qualitative or semi-quantitative assessment of the amounts of crystalline or amorphous fraction in a sample. The greatest barrier to establishing quantitative XRD is the lack of appropriate cellulose standards, which are needed to calibrate the XRD measurements. In practice, samples with known CI are very difficult to prepare or determine. In a previous study,<sup>14</sup> we reported the development of a simple algorithm for determining fiber crystallinity information from Fourier transform infrared (FT-IR) spectroscopy. Hence, in this study we not only compared the fiber crystallinity information between FT-IR and XRD measurements, by developing a simple XRD algorithm in place of a time-consuming and subjective curve-fitting process, but we also suggested a direct way of determining cotton cellulose CI by calibrating XRD with the use of CI<sub>IR</sub> as references.

Citation
Yongliang Liu, Devron Thibodeaux, Gary Gamble, Philip Bauer, and Don VanDerveer, "Comparative Investigation of Fourier Transform Infrared (FT-IR) Spectroscopy and X-ray Diffraction (XRD) in the Determination of Cotton Fiber Crystallinity," Appl. Spectrosc. 66, 983-986 (2012)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-66-8-983


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