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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 68, Iss. 1 — Jan. 1, 2014
  • pp: 39–43

In Situ Monitoring of Thermal Crystallization of Ultrathin Tris(8-Hydroxyquinoline) Aluminum Films Using Surface-Enhanced Raman Scattering

Naoki Muraki

Applied Spectroscopy, Vol. 68, Issue 1, pp. 39-43 (2014)


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Abstract

Thermal crystallization of 3, 10, and 60 nm-thick tris(8-hydroxyquinoline)aluminum (Alq3) films is studied using surface-enhanced Raman scattering with a constant heating rate. An abrupt higher frequency shift of the quinoline-stretching mode is found to be an indication of a phase transition of Alq3 molecules from amorphous to crystalline. While the 60 nm-thick film shows the same crystallization temperature as a bulk sample, the thinner films were found to have a lower crystallization temperature and slower rate of crystallization. Non-isothermal kinetics analysis is performed to quantify kinetic properties such as the Avrami exponent constants and crystallization rates of ultrathin Alq3 films.

Citation
Naoki Muraki, "In Situ Monitoring of Thermal Crystallization of Ultrathin Tris(8-Hydroxyquinoline) Aluminum Films Using Surface-Enhanced Raman Scattering," Appl. Spectrosc. 68, 39-43 (2014)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-68-1-39


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