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Biomedical Optics Express

Biomedical Optics Express

  • Editor: Joseph A. Izatt
  • Vol. 3, Iss. 9 — Sep. 1, 2012
  • pp: 2175–2183

Label-free characterization of living human induced pluripotent stem cells by subcellular topographic imaging technique using full-field quantitative phase microscopy coupled with interference reflection microscopy

Norikazu Sugiyama, Yasuyuki Asai, Toyohiko Yamauchi, Takuji Kataoka, Takahiro Ikeda, Hidenao Iwai, Takashi Sakurai, and Yoshinori Mizuguchi  »View Author Affiliations


Biomedical Optics Express, Vol. 3, Issue 9, pp. 2175-2183 (2012)
http://dx.doi.org/10.1364/BOE.3.002175


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Abstract

There is a need for a noninvasive technique to monitor living pluripotent stem cell condition without any labeling. We present an optical imaging technique that is able to capture information about optical path difference through the cell and cell adhesion properties simultaneously using a combination of quantitative phase microscopy (QPM) and interference reflection microscopy (IRM) techniques. As a novel application of QPM and IRM, this multimodal imaging technique demonstrated its ability to distinguish the undifferentiated status of human induced pluripotent stem (hiPS) cells quantitatively based on the variation of optical path difference between the nucleus and cytoplasm as well as hiPS cell-specific cell adhesion properties.

© 2012 OSA

OCIS Codes
(110.4190) Imaging systems : Multiple imaging
(180.3170) Microscopy : Interference microscopy

ToC Category:
Microscopy

History
Original Manuscript: June 13, 2012
Revised Manuscript: August 2, 2012
Manuscript Accepted: August 19, 2012
Published: August 22, 2012

Citation
Norikazu Sugiyama, Yasuyuki Asai, Toyohiko Yamauchi, Takuji Kataoka, Takahiro Ikeda, Hidenao Iwai, Takashi Sakurai, and Yoshinori Mizuguchi, "Label-free characterization of living human induced pluripotent stem cells by subcellular topographic imaging technique using full-field quantitative phase microscopy coupled with interference reflection microscopy," Biomed. Opt. Express 3, 2175-2183 (2012)
http://www.opticsinfobase.org/boe/abstract.cfm?URI=boe-3-9-2175


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