Wide measurement range scanning heterodyne interferometer utilizing astigmatic position sensing scheme

• Abstract

• Optics Letters, Vol. 36, Issue 16, pp. 3112-3114 (August 2011)
• Youngkyu Park, Kyoung-Eop Kim, Seong-Jin Kim, June-Gyu Park, Young-Hun Joo, Bu Hyun Shin, Seung-Yop Lee, Kyuman Cho

High-numerical-aperture microlens shape measurement with digital holographic microscopy

• Abstract

• Optics Letters, Vol. 36, Issue 22, pp. 4419-4421 (November 2011)
• Tomasz Kozacki, Michał Józwik, Kamil Liżewski

Multiview phase shifting: a full-resolution and high-speed 3D measurement framework for arbitrary shape dynamic objects

• Abstract
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• Optics Letters, Vol. 38, Issue 9, pp. 1389-1391 (May 2013)
• Zhongwei Li, Kai Zhong, Y. F. Li, Xiaohui Zhou, Yusheng Shi

Digital holographic microscope for measurement of high gradient deep topography object based on superresolution concept

• Abstract

• Optics Letters, Vol. 38, Issue 11, pp. 1878-1880 (June 2013)
• Kamil Liżewski, Tomasz Kozacki, Julianna Kostencka

A multiple height-transfer interferometric technique

• Abstract

• Optics Express, Vol. 19, Issue 17, pp. 16365-16374 (August 2011)
• Hao Yu, Carl Aleksoff, Jun Ni

Method of surface topography retrieval by direct solution of sparse weighted seminormal equations

• Abstract
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• Optics Express, Vol. 20, Issue 2, pp. 1714-1726 (January 2012)
• Jeffrey Koskulics, Steven Englehardt, Steven Long, Yongxiang Hu, Knut Stamnes

Space position measurement using long-path heterodyne interferometer with optical frequency comb

• Abstract

• Optics Express, Vol. 20, Issue 3, pp. 2725-2732 (January 2012)
• Xiaonan Wang, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto

Improved signal model for confocal sensors accounting for object depending artifacts

• Abstract

• Optics Express, Vol. 20, Issue 18, pp. 19936-19945 (August 2012)
• Florian Mauch, Wolfram Lyda, Marc Gronle, Wolfgang Osten

Phase coding method for absolute phase retrieval with a large number of codewords

• Abstract

• Optics Express, Vol. 20, Issue 22, pp. 24139-24150 (October 2012)
• Dongliang Zheng, Feipeng Da

Simultaneous multiple view high resolution surface geometry acquisition using structured light and mirrors

• Abstract

• Optics Express, Vol. 21, Issue 6, pp. 7222-7239 (March 2013)
• Hector R.A. Basevi, James A. Guggenheim, Hamid Dehghani, Iain B. Styles

A simple, flexible and automatic 3D calibration method for a phase calculation-based fringe projection imaging system

• Abstract

• Optics Express, Vol. 21, Issue 10, pp. 12218-12227 (May 2013)
• Zonghua Zhang, Shujun Huang, Shasha Meng, Feng Gao, Xiangqian Jiang

Application of generalized grating imaging to pattern projection in three-dimensional profilometry

• Abstract

• Applied Optics, Vol. 50, Issue 26, pp. 5115-5121 (September 2011)
• Koichi Iwata, Yusuke Sando, Kazuo Satoh, Kousuke Moriwaki

Three-dimensional phase step profilometry with a multicore optical fiber

• Abstract

• Applied Optics, Vol. 51, Issue 8, pp. 1045-1048 (March 2012)
• Ari Novack, David D’Annunzio, Ekin Doğuş Çubuk, Naci Inci, Lynne Molter

Improved algorithm for phase-to-height mapping in phase measuring profilometry

• Abstract

• Applied Optics, Vol. 51, Issue 8, pp. 1149-1155 (March 2012)
• Yanshan Xiao, Yiping Cao, Yingchun Wu

Flexible structured-light-based three-dimensional profile reconstruction method considering lens projection-imaging distortion

• Abstract

• Applied Optics, Vol. 51, Issue 13, pp. 2419-2428 (May 2012)
• Suodong Ma, Rihong Zhu, Chenggen Quan, Lei Chen, Cho Jui Tay, Bo Li

Color fringe-projected technique for measuring dynamic objects based on bidimensional empirical mode decomposition

• Abstract

• Applied Optics, Vol. 51, Issue 16, pp. 3622-3630 (June 2012)
• Hai-hua Zou, Xiang Zhou, Hong Zhao, Tao Yang, Hu-bing Du, Fei-fei Gu, Zi-xin Zhao

Accuracy of a multiple height-transfer interferometric technique for absolute distance metrology

• Abstract

• Applied Optics, Vol. 51, Issue 21, pp. 5283-5294 (July 2012)
• Hao Yu, Carl Aleksoff, Jun Ni

Method to test rotationally asymmetric surface deviation with high accuracy

• Abstract

• Applied Optics, Vol. 51, Issue 22, pp. 5567-5572 (August 2012)
• Weihong Song, Fan Wu, Xi Hou

Laser focus positioning method with submicrometer accuracy

• Abstract

• Applied Optics, Vol. 52, Issue 3, pp. 415-421 (January 2013)
• Ilya Alexeev, Johannes Strauss, Andreas Gröschl, Kristian Cvecek, Michael Schmidt

Soft imprint lithography of a bulk chalcogenide glass

• Abstract

• Optical Materials Express, Vol. 1, Issue 5, pp. 796-802 (September 2011)
• Jiri Orava, Tomas Kohoutek, A. Lindsay Greer, Hiroshi Fudouzi