Measurement of all orthogonal components of displacement in the volume of scattering materials using wavelength scanning interferometry

• Abstract

• JOSA A, Vol. 29, Issue 9, pp. 1776-1785 (September 2012)
• Semanti Chakraborty, Pablo D. Ruiz

Electronic speckle-pattern interferometer using holographic optical elements for vibration measurements

• Abstract

• Optics Letters, Vol. 35, Issue 19, pp. 3273-3275 (October 2010)
• Viswanath Bavigadda, Raghavendra Jallapuram, Emilia Mihaylova, Vincent Toal

Mode-shape measurement of piezoelectric plate using temporal speckle pattern interferometry and temporal standard deviation

• Abstract

• Optics Letters, Vol. 36, Issue 21, pp. 4281-4283 (November 2011)
• Ching-Yuan Chang, Chien-Ching Ma

The oriented spatial filter masks for electronic speckle pattern interferometry phase patterns

• Abstract

• Optics Express, Vol. 18, Issue 9, pp. 8942-8947 (April 2010)
• Chen Tang, Tao Gao, Si Yan, Linlin Wang, Jian Wu

High-speed, sub-Nyquist interferometry

• Abstract

• Optics Express, Vol. 19, Issue 11, pp. 10111-10123 (May 2011)
• Tao Wu, Jesus D. Valera, Andrew J. Moore

Dynamic phase retrieval in temporal speckle pattern interferometry using least squares method and windowed Fourier filtering

• Abstract
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• Optics Express, Vol. 19, Issue 19, pp. 18058-18066 (September 2011)
• Li Kai, Qian Kemao

Adaptive noise reduction method for DSPI fringes based on bi-dimensional ensemble empirical mode decomposition

• Abstract

• Optics Express, Vol. 19, Issue 19, pp. 18207-18215 (September 2011)
• Yi Zhou, Hongguang Li

Anisotropic coupled diffusion filter and binarization for the electronic speckle pattern interferometry fringes

• Abstract

• Optics Express, Vol. 20, Issue 20, pp. 21905-21916 (September 2012)
• Fang Zhang, Zhitao Xiao, Jun Wu, Lei Geng, Hongqiang Li, Jiangtao Xi, Jinjiang Wang

Quantitative shearography: error reduction by using more than three measurement channels

• Abstract

• Applied Optics, Vol. 50, Issue 2, pp. 134-146 (January 2011)
• Tom O. H. Charrett, Daniel Francis, Ralph P. Tatam

Measurement of nanometric displacements by correlating two speckle interferograms

• Abstract

• Applied Optics, Vol. 50, Issue 12, pp. 1758-1764 (April 2011)
• Lucas P. Tendela, Gustavo E. Galizzi, Alejandro Federico, Guillermo H. Kaufmann

Application of the radial basis function interpolation to phase extraction from a single electronic speckle pattern interferometric fringe

• Abstract

• Applied Optics, Vol. 50, Issue 19, pp. 3110-3117 (July 2011)
• Gao Wang, Yang Jun Li, Han Chang Zhou

Enlarging the angle of view in Michelson-interferometer-based shearography by embedding a 4f system

• Abstract

• Applied Optics, Vol. 50, Issue 21, pp. 3789-3794 (July 2011)
• Sijin Wu, Xiaoyuan He, Lianxiang Yang

Double-exposure phase calculation method in electronic speckle pattern interferometry based on holographic object illumination

• Abstract

• Applied Optics, Vol. 50, Issue 23, pp. 4642-4647 (August 2011)
• Richárd Séfel, János Kornis

Localized Fourier transform filter for noise removal in electronic speckle pattern interferometry wrapped phase patterns

• Abstract

• Applied Optics, Vol. 50, Issue 24, pp. 4903-4911 (August 2011)
• Cancan Li, Chen Tang, Haiqing Yan, Linlin Wang, Hao Zhang

Speckle and fringe dynamics in imaging-speckle-pattern interferometry for spatial-filtering velocimetry

• Abstract

• Applied Optics, Vol. 50, Issue 28, pp. 5577-5591 (October 2011)
• Michael L. Jakobsen, Theis F. Q. Iversen, Harold T. Yura, Steen G. Hanson

Measurement of in-plane displacement by wavelength-modulated heterodyne speckle interferometry

• Abstract

• Applied Optics, Vol. 51, Issue 8, pp. 1095-1100 (March 2012)
• Ju-Yi Lee, Ming-Pei Lu, Kun-Yi Lin, Szu-Han Huang

Overview of anisotropic filtering methods based on partial differential equations for electronic speckle pattern interferometry

• Abstract

• Applied Optics, Vol. 51, Issue 20, pp. 4916-4926 (July 2012)
• Chen Tang, Linlin Wang, Haiqing Yan

Speckle-noise-reduction method of projecting interferometry fringes based on power spectrum density

• Abstract

• Applied Optics, Vol. 51, Issue 29, pp. 6974-6978 (October 2012)
• Liping Zhou, Jianghong Gan, Xiaojun Liu, Long Xu, Wenlong Lu

Application of two oriented partial differential equation filtering models on speckle fringes with poor quality and their numerically fast algorithms

• Abstract

• Applied Optics, Vol. 52, Issue 9, pp. 1814-1823 (March 2013)
• Xinjun Zhu, Zhanqing Chen, Chen Tang, Qinghua Mi, Xiusheng Yan

Toward fast malaria detection by secondary speckle sensing microscopy

• Abstract

• Biomedical Optics Express, Vol. 3, Issue 5, pp. 991-1005 (May 2012)
• Dan Cojoc, Sara Finaurini, Pavel Livshits, Eran Gur, Alon Shapira, Vicente Mico, Zeev Zalevsky