Quadriwave lateral shearing interferometry in an achromatic and continuously self-imaging regime for future x-ray phase imaging

• Abstract

• Optics Letters, Vol. 36, Issue 8, pp. 1398-1400 (April 2011)
• Julien Rizzi, Timm Weitkamp, Nicolas Guérineau, Mourad Idir, Pascal Mercère, Guillaume Druart, Grégory Vincent, Paulo da Silva, Jérôme Primot

Experimental characterization of the coherence properties of hard x-ray sources

• Abstract

• Optics Express, Vol. 19, Issue 9, pp. 8073-8078 (April 2011)
• Daniele Pelliccia, Andrei Y. Nikulin, Herbert O. Moser, Keith A. Nugent

Four-dimensional X-ray phase tomography with Talbot interferometry and white synchrotron radiation: dynamic observation of a living worm

• Abstract
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• Optics Express, Vol. 19, Issue 9, pp. 8423-8432 (April 2011)
• Atsushi Momose, Wataru Yashiro, Sébastien Harasse, Hiroaki Kuwabara

X-ray optics simulation using Gaussian superposition technique

• Abstract

• Optics Express, Vol. 19, Issue 20, pp. 19050-19060 (September 2011)
• Mourad Idir, Moisés Cywiak, Arquímedes Morales, Mohammed H. Modi

Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging

• Abstract

• Optics Express, Vol. 19, Issue 22, pp. 21333-21344 (October 2011)
• Joan Vila-Comamala, Ana Diaz, Manuel Guizar-Sicairos, Alexandre Mantion, Cameron M. Kewish, Andreas Menzel, Oliver Bunk, Christian David

Thermal stability of Mg/Co multilayer with B₄C, Mo or Zr diffusion barrier layers

• Abstract

• Optics Express, Vol. 19, Issue 22, pp. 21849-21854 (October 2011)
• Jingtao Zhu, Sika Zhou, Haochuan Li, Zhanshan Wang, Philippe Jonnard, Karine Le Guen, Min-Hui Hu, Jean-Michel André, Hongjun Zhou, Tonglin Huo

Multi-wavelength elemental contrast absorption imaging

• Abstract

• Optics Express, Vol. 19, Issue 27, pp. 25969-25980 (December 2011)
• Mac B. Luu, Chanh Q. Tran, Benedicta Arhatari, Eugeniu Balaur, Nirgel Kirby, Stephen Mudie, Bao T. Pham, Nghia T. Vo, Corey T. Putkunz, Francesco De Carlo, Andrew G. Peele

Phase contrast laminography based on Talbot interferometry

• Abstract

• Optics Express, Vol. 20, Issue 6, pp. 6496-6508 (March 2012)
• Venera Altapova, Lukas Helfen, Anton Myagotin, Daniel Hänschke, Julian Moosmann, Jan Gunneweg, Tilo Baumbach

Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approach

• Abstract

• Optics Express, Vol. 20, Issue 11, pp. 12393-12406 (May 2012)
• Peng Su, Yuhao Wang, James H. Burge, Konstantine Kaznatcheev, Mourad Idir

A quantitative, non-interferometric X-ray phase contrast imaging technique

• Abstract

• Optics Express, Vol. 21, Issue 1, pp. 647-661 (January 2013)
• Peter R.T. Munro, Luigi Rigon, Konstantin Ignatyev, Frances C.M. Lopez, Diego Dreossi, Robert D. Speller, Alessandro Olivo

On the resolution and linearity of lensless in situ X-ray beam diagnostics using pixelated sensors

• Abstract

• Optics Express, Vol. 21, Issue 4, pp. 4291-4302 (February 2013)
• Anton Kachatkou, Roelof van Silfhout

Inner-focusing reconstruction method for grating-based phase-contrast CT

• Abstract

• Optics Express, Vol. 21, Issue 5, pp. 6224-6232 (March 2013)
• Yan Xi, Jun Zhao

The theoretical analysis of the hard X-ray block-structure supermirror

• Abstract

• Optics Express, Vol. 21, Issue 7, pp. 8638-8651 (April 2013)
• Youwei Yao, Hideyo Kunieda, Zhanshan Wang

Ion beam lithography for Fresnel zone plates in X-ray microscopy

• Abstract

• Optics Express, Vol. 21, Issue 10, pp. 11747-11756 (May 2013)
• Kahraman Keskinbora, Corinne Grévent, Michael Bechtel, Markus Weigand, Eberhard Goering, Achim Nadzeyka, Lloyd Peto, Stefan Rehbein, Gerd Schneider, Rolf Follath, Joan Vila-Comamala, Hanfei Yan, Gisela Schütz

Exact revision of the elliptically bent mirror theory

• Abstract

• Applied Optics, Vol. 50, Issue 16, pp. 2413-2417 (June 2011)
• Chengwen Mao, Xiaohan Yu, Tiqiao Xiao, Aiguo Li, Ke Yang, Hua Wang, Fen Yan, Biao Deng

X-ray magneto-optical polarization spectroscopy: an analysis from the visible region to the x-ray regime

• Abstract

• Applied Optics, Vol. 52, Issue 18, pp. 4294-4310 (June 2013)
• M. F. Tesch, M. C. Gilbert, H.-Ch. Mertins, D. E. Bürgler, U. Berges, C. M. Schneider

Accuracy and analysis of long-radius measurement with long trace profiler

• Abstract

• Chinese Optics Letters, Vol. 9, Issue 10, pp. 102301- (October 2011)
• Haixian Ye, Liming Yang

Small d-spacing WSi₂/Si multilayers for X-ray monochromators

• Abstract

• Chinese Optics Letters, Vol. 10, Issue 12, pp. 123401-123401 (December 2012)
• Qiushi Huang, Haochuan Li, Jingtao Zhu, Zhanshan Wang, Yongjian Tang

Talbot-defocus multiscan tomography using the synchrotron X-ray microscope to study the lacuno-canalicular network in mouse bone

• Abstract

• Biomedical Optics Express, Vol. 4, Issue 6, pp. 917-923 (June 2013)
• Nobuhito Nango, Shogo Kubota, Akihisa Takeuchi, Yoshio Suzuki, Wataru Yashiro, Atsushi Momose, Koichi Matsuo

DFT and synchrotron radiation study of Eu²⁺ doped BaAl₂O₄

• Abstract

• Optical Materials Express, Vol. 2, Issue 4, pp. 420-431 (April 2012)
• Hermi F. Brito, Maria C. F. C. Felinto, Jorma Hölsä, Taneli Laamanen, Mika Lastusaari, Marja Malkamäki, Pavel Novák, Lucas C. V. Rodrigues, Roberval Stefani