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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 8, Iss. 6 — Jun. 1, 2010
  • pp: 598–600

Laser-conditioning mechanism of ZrO2/SiO2 HR films with fitting damage probability curves of laser-induced damage

Xiao Li, Xiaofeng Liu, Yuan'an Zhao, Jianda Shao, and Zhengxiu Fan  »View Author Affiliations


Chinese Optics Letters, Vol. 8, Issue 6, pp. 598-600 (2010)


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Abstract

The method of fitting damage probability curves of laser-induced damage is introduced to investigate the laser-conditioning mechanism of ZrO2/SiO2 high re°ection (HR) films. The laser-induced damage thresholds (LIDTs) of the sample are tested before and after the laser-conditioning scanning process. The parameters of the defects are obtained through the fitting process of the damage probability curve. It can be concluded that the roles of laser conditioning include two aspects: removing defects with lower threshold and producing new defects with higher threshold. The effect of laser conditioning is dependent on the competition of these two aspects.

© 2010 Chinese Optics Letters

OCIS Codes
(140.3330) Lasers and laser optics : Laser damage
(310.6870) Thin films : Thin films, other properties

Citation
Xiao Li, Xiaofeng Liu, Yuan'an Zhao, Jianda Shao, and Zhengxiu Fan, "Laser-conditioning mechanism of ZrO2/SiO2 HR films with fitting damage probability curves of laser-induced damage," Chin. Opt. Lett. 8, 598-600 (2010)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-8-6-598

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