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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 1, Iss. 4 — Apr. 20, 2003
  • pp: 231–233

Laser induced fractal structure on magnetic dielectric thin film

Qihong Lou and Feng Huang  »View Author Affiliations


Chinese Optics Letters, Vol. 1, Issue 4, pp. 231-233 (2003)


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Abstract

The Richardson plots method is employed to measure the fractal dimensions D of the surface of magnetic dielectric film fractured by excimer laser irradiation near the ablation threshold. It is shown that the fractured surfaces are fractal character. The value of D decreases while the laser pulse number increases. This relation may reflect how the fractured surface changes from irregular structure to regular structure with laser pulse number.

© 2005 Chinese Optics Letters

OCIS Codes
(310.3840) Thin films : Materials and process characterization

Citation
Qihong Lou and Feng Huang, "Laser induced fractal structure on magnetic dielectric thin film," Chin. Opt. Lett. 1, 231-233 (2003)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-1-4-231


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