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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 1, Iss. 7 — Jul. 20, 2003
  • pp: 401–403

Bend effect of the electrode for travelling wave integrated electro-optic modulators

Fuwen Zhang, Fushen Chen, and Kun Qiu  »View Author Affiliations


Chinese Optics Letters, Vol. 1, Issue 7, pp. 401-403 (2003)


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Abstract

In this paper, we have studied electrode bend effects on electrical characteristics of the modulator in the three aspects, which are arc length, characteristic impedance, and loss, applying the model in Ref. [1] and the finite element method (FEM). The results have shown that the effect only caused by the characteristic impedance is necessarily considered while its deviation is large, but others are negligible as we design a practical device. Finally, some transmission characteristics of coplanar line with different arc length of the bend have been tested, and the measured results are in good agreement with the theoretical analyses.

© 2005 Chinese Optics Letters

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(250.0250) Optoelectronics : Optoelectronics

Citation
Fuwen Zhang, Fushen Chen, and Kun Qiu, "Bend effect of the electrode for travelling wave integrated electro-optic modulators," Chin. Opt. Lett. 1, 401-403 (2003)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-1-7-401


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References

  1. R. Krahenbuhl and W. K. Burns, IEEE Trans. Microwave Theory Technol. 48, 860 (2000).
  2. K. Noguchi, H. Miyazawa, and O. Mitomi, Electron. Lett. 34, 661 (1998).
  3. G. K. Gopalakrishnan, W. K. Burns, and C. H. Bulmer, Electron. Lett. 28, 207 (1992).
  4. A. A. Aboul-Enien, T. E. Taha, A. A. Abou El-fadl, and K. A. Mostafa, in Proceedings of Eighteen National Radio Science Conference (2001) p. 585.

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