Abstract

A polarization Fizeau interferometer based on birefringent thin film is presented. The interferometer adopts a birefringent thin film to obtain orthogonally polarized and strictly common-path reference and test beams. Advantages include ease of implementation on large-aperture interferometer, measuring test optics from long distance, and achieving high fringe visibility. The phase shift is obtained by combining a quarterwave plate and an analyzer. The concepts illustrated are verified experimentally.

© 2012 Chinese Optics Letters

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