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Optica Publishing Group
  • Chinese Optics Letters
  • Vol. 10,
  • Issue 9,
  • pp. 090501-090501
  • (2012)

Fabrication and characterization of sliced multilayer transmission grating for X-ray region

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Abstract

To develop high quality dispersion optics in the X-ray region, the sliced multilayer transmission grating is examined. Dynamical diffraction theory is used to calculate the diffraction property of this volume grating. A WSi<sub>2</sub>/Si multilayer with a d-spacing of 14.3 nm and bi-layer number of 300 is deposited on a superpolished silicon substrate by direct current magnetron sputtering technology. To make the transmission grating, the multilayer is sliced and thinned in the cross-section direction to a depth of 23-25 μm. The diffraction efficiency of the grating is measured at E = 8.05 keV, and the 1st-order efficiency is 19%. The sliced multilayer grating with large aspect ratio and nanometer period can be used for high efficiency and high dispersion optics in the X-ray region.

© 2012 Chinese Optics Letters

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