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Chinese Optics Letters

Chinese Optics Letters


  • Vol. 11, Iss. 2 — Feb. 1, 2013
  • pp: 021102–

Improved illumination for vision-based defect inspection of highly reflective metal surface

Lin Li, Zhong Wang, Fangying Pei, and Xiangjun Wang  »View Author Affiliations

Chinese Optics Letters, Vol. 11, Issue 2, pp. 021102- (2013)

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Specular and strong reflections are the main problems encountered during part image defect inspection of shiny or highly reflective surfaces. In this letter, we propose an improved illumination method for defect inspection. A diffuse light source is designed based on the physics analysis of light reflection. The distribution of intensity is simulated according to a known model to verify the illumination uniformity of the source. Experiments show that defect expressivity when using the proposed illumination method has a better performance. The optical model is not only suitable for the defect detection of metal balls but also for the defect detection of planes and cylinders.

© 2013 Chinese Optics Letters

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(150.0150) Machine vision : Machine vision
(290.0290) Scattering : Scattering

Lin Li, Zhong Wang, Fangying Pei, and Xiangjun Wang, "Improved illumination for vision-based defect inspection of highly reflective metal surface," Chin. Opt. Lett. 11, 021102- (2013)

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