OSA's Digital Library

Chinese Optics Letters

Chinese Optics Letters


  • Editor: Zhizhan Xu
  • Vol. 11, Iss. 3 — Mar. 1, 2013
  • pp: 032501–

Echelle dif fraction grating based high-resolution spectrometer-on-chip on SiON waveguide platform

Xiao Ma, Jianjun He, and Mingyu Li  »View Author Affiliations

Chinese Optics Letters, Vol. 11, Issue 3, pp. 032501- (2013)

View Full Text Article

Acrobat PDF (963 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

  • Export Citation/Save Click for help


An echelle diffraction grating based high-resolution spectrometer-on-chip on silicon oxynitride (SiON) waveguide platform operated at a wavelength range of 850 nm is demonstrated. The chip comprises 120 output waveguides with 0.25-nm wavelength channel spacing and has a size of only 11 × 6 (mm). The experimental results show that the insertion loss is -14 dB, the measured adjacent channel crosstalk is less than -25 dB, the 3 dB channel bandwidth is < 0.1 nm, and the channel non-uniformity is 3 dB for 56 channels with a wavelength ranging from 838 to 852 nm.

© 2013 Chinese Optics Letters

OCIS Codes
(230.3120) Optical devices : Integrated optics devices
(250.3140) Optoelectronics : Integrated optoelectronic circuits

ToC Category:

Xiao Ma, Jianjun He, and Mingyu Li, "Echelle dif fraction grating based high-resolution spectrometer-on-chip on SiON waveguide platform," Chin. Opt. Lett. 11, 032501- (2013)

Sort:  Author  |  Year  |  Journal  |  Reset


  1. K. Kodate and Y. Komai, J. Opt. A: Pure Appl. Opt. 10, 044011 (2008).
  2. L. Qin, L. Wang, M. Li, and J.-J. He, IEEE Photon. Technol. Lett. 24, 954 (2012).
  3. P. Cheben, J. H. Schmid, A. Delage, A. Densmore, S. Janz, B. Lamontagne, J. Lapointe, E. Post, P. Waldron, and D.-X. Xu, Opt. Express 15, 2299 (2007).
  4. B. B. Kyotoku, L. Chen, and M. Lipson, Opt. Express 18, 102 (2010).
  5. M. I. Alayo, D. Criado, L. C. D. Goncalves, and I. Pereyra, J. Non-Cryst. Sol. 338, 76 (2004).
  6. N. Ismail, L. P. Choo-Smith, K. Worhoff, A. Driessen, A. C. Baclig, P. J. Caspers, G. J. Puppels, R. M. de Ridder, and M. Pollnau, Opt. Lett. 36, 4629 (2011).
  7. B. I. AKca, V. D. Nguyen, J. Kalkman, N. Ismail, G. Sengo, F. Sun, A. Driessen, T. G. van Leeuwen, M. Pollnau, K. Worhoff, and R. M. de Ridder, IEEE J. Select. Topics Quantum Electron. 18, 1223 (2012).
  8. V. D. Nguyen, B. I. Akca, K. Worhoff, R. M. de Ridder, M. Pollnau, T. G. van Leeuwen, and J. Kalkman, Opt. Lett. 36, 1293 (2011).
  9. J.-J. He, B. Lamontagne, A. Delage, L. Erickson, M. Davis, and E. S. Koteles, J. Lightwave Technol. 16, 631 (1998).
  10. L. Wang, J.-J. He, J. Song, and S. He, J. Lightwave Technol. 24, 3743 (2006).
  11. B. Kim, K.-H. Kwon, and S.-H. Park, J. Vac. Sci. Technol. A 17, 2593 (1999).
  12. J.-H. Kim, G. Liu, and S. H. Kim, J. Mater. Chem. 16, 977 (2006).
  13. H. Nakata, K. Nishioka, and H. Abe, J. Vaccum Sci. Technol. 17, 1351 (1980).
  14. G. S. Oehrlein, P. J. Matsuo, M. F. Doemling, N. R. Rueger, B. E. E. Kastenmeier, M. Schaepkens, T. Standaert, and J. J. Beulens, Plasma Sources Sci. Technol. 5, 193 (1996).
  15. J.-J. He, E. S. Koteles, B. Lamontagne, L. Erickson, A. Delage, and M. Davies, IEEE Photon. Technol. Lett. 11, 224 (1999).

Cited By

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited