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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Editor: Zhizhan Xu
  • Vol. 11, Iss. 3 — Mar. 1, 2013
  • pp: 032501–

Echelle dif fraction grating based high-resolution spectrometer-on-chip on SiON waveguide platform

Xiao Ma, Jianjun He, and Mingyu Li  »View Author Affiliations


Chinese Optics Letters, Vol. 11, Issue 3, pp. 032501- (2013)


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Abstract

An echelle diffraction grating based high-resolution spectrometer-on-chip on silicon oxynitride (SiON) waveguide platform operated at a wavelength range of 850 nm is demonstrated. The chip comprises 120 output waveguides with 0.25-nm wavelength channel spacing and has a size of only 11 × 6 (mm). The experimental results show that the insertion loss is -14 dB, the measured adjacent channel crosstalk is less than -25 dB, the 3 dB channel bandwidth is < 0.1 nm, and the channel non-uniformity is 3 dB for 56 channels with a wavelength ranging from 838 to 852 nm.

© 2013 Chinese Optics Letters

OCIS Codes
(230.3120) Optical devices : Integrated optics devices
(250.3140) Optoelectronics : Integrated optoelectronic circuits

ToC Category:
Optoelectronics

Citation
Xiao Ma, Jianjun He, and Mingyu Li, "Echelle dif fraction grating based high-resolution spectrometer-on-chip on SiON waveguide platform," Chin. Opt. Lett. 11, 032501- (2013)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-11-3-032501

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