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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Editor: Zhizhan Xu
  • Vol. 11, Iss. 9 — Sep. 1, 2013
  • pp: 091403–

Simulation of cross-correlation method for temporal characterization of VUV free-electron-lasers

Wenbin Li, Xiaoying Ma, Xiaoyue Yang, and Zhanshan Wang  »View Author Affiliations


Chinese Optics Letters, Vol. 11, Issue 9, pp. 091403- (2013)


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Abstract

The cross-correlation method for temporal characterization is investigated using simulations of the twocolor above threshold ionization (ATI) on He induced by a vacuum ultraviolet (VUV) free-electron laser (FEL) in the presence of an infrared (IR) field. Non-linear dependencies of the sideband structure produced in the two-color ATI process are expressed as a function of IR laser intensity by considering the spatial distributions and temporal jitter of both lasers. The temporal properties of the FEL pulse can be characterized accurately using the cross-correlation method at a low IR laser intensity of ~3 \times 10^{10} W/cm2 but with low cross-correlation signals. When the dynamic range of sidebands is increased to high IR intensity, the accuracy of the cross-correlation method becomes crucially dependent on the actual nonlinear index. An approach of determining this index is proposed here to improve the accuracy of temporal characterizations.

© 2013 Chinese Optics Letters

OCIS Codes
(020.4180) Atomic and molecular physics : Multiphoton processes
(140.2600) Lasers and laser optics : Free-electron lasers (FELs)
(320.2250) Ultrafast optics : Femtosecond phenomena

ToC Category:
Lasers and Laser Optics

Citation
Wenbin Li, Xiaoying Ma, Xiaoyue Yang, and Zhanshan Wang, "Simulation of cross-correlation method for temporal characterization of VUV free-electron-lasers," Chin. Opt. Lett. 11, 091403- (2013)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-11-9-091403

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