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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Editor: Zhizhan Xu
  • Vol. 12, Iss. 2 — Feb. 1, 2014
  • pp: 020501–

High focusing grating reflectors with TE-polarized normal incidence

Ting Ma, Xiaodong Yuan, Weimin Ye, Wei Xu, Shiqiao Qin, and Zhihong Zhu  »View Author Affiliations


Chinese Optics Letters, Vol. 12, Issue 2, pp. 020501- (2014)


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Abstract

We design two types of reflectors by using subwavelength high-index contrast gratings, which exhibit similar high focusing capabilities at normal incidence with a TE-polarized plane wave. One type has bars of different heights, whereas the other has bars of different depths. Both grating reflectors are designed to be approximately 22 \mu m in structural length and 10 \mu m in focal length, at an operating wavelength of 1.55 \mu m. Both achieve a full-width-half-maximum of 0.9 \mu m at the focal plane, which is fairly close to the diffraction limit. Their reflectance reach as high as 94% and 91%.

© 2014 Chinese Optics Letters

OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(050.5080) Diffraction and gratings : Phase shift
(230.4040) Optical devices : Mirrors
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Diffraction and Gratings

Citation
Ting Ma, Xiaodong Yuan, Weimin Ye, Wei Xu, Shiqiao Qin, and Zhihong Zhu, "High focusing grating reflectors with TE-polarized normal incidence," Chin. Opt. Lett. 12, 020501- (2014)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-12-2-020501

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