Abstract

We propose a wideband transverse magnetic-reflected polarizing film composed of Cr and SiO2. Based on the polarization characteristics of reflected light from Cr/SiO2 film, the film can serves as a polarizer to severely attenuate the transverse electric (TE)-polarized light and reflect the transverse magnetic (TM)-polarized light in a wavelength range from 600 to 900 nm. By suitably choosing the film thicknesses, the operation angles of such polarizers can be adjusted over a wide angle range greater than the critical angle of total reflection. Cr/SiO2 film has potential use in surface plasmon resonance (SPR) sensors based on Kretchmann configuration to form integrated structures.

© 2014 Chinese Optics Letters

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