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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Editor: Zhizhan Xu
  • Vol. 12, Iss. 9 — Sep. 1, 2014
  • pp: 092901–

Calculation and analysis of Mueller matrix in light scattering detection

Keding Yan, Shouyu Wang, Shu Jiang, Liang Xue, Yuanyuan Song, Zhengang Yan, and Zhenhua Li  »View Author Affiliations


Chinese Optics Letters, Vol. 12, Issue 9, pp. 092901- (2014)


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Abstract

A new criterion for target detection and identification is proposed to realize metal/dielectric identification and recognition based on Mueller matrix analysis. By using randomly rough surfaces as targets, numerical calculations are used to prove the robustness and accuracy of the criterion. Moreover, to the best of our knowledge, this is the first time to successfully explain the criterion by theoretical analysis. We believe the work provides an important reference for polarization imaging in laser radar and remote sensing, and so on.

© 2014 Chinese Optics Letters

OCIS Codes
(240.0240) Optics at surfaces : Optics at surfaces
(240.5770) Optics at surfaces : Roughness
(290.0290) Scattering : Scattering
(290.5880) Scattering : Scattering, rough surfaces

ToC Category:
Scattering

Citation
Keding Yan, Shouyu Wang, Shu Jiang, Liang Xue, Yuanyuan Song, Zhengang Yan, and Zhenhua Li, "Calculation and analysis of Mueller matrix in light scattering detection," Chin. Opt. Lett. 12, 092901- (2014)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-12-9-092901

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