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Chinese Optics Letters

Chinese Optics Letters


  • Vol. 2, Iss. 1 — Jan. 10, 2004
  • pp: 27–28

Elliptically-bent crystal spectrograph for X-ray diagnosis of laser-produced plasmas

Xiancai Xiong, Xianxin Zhong, Shali Xiao, Guohong Yang, and Jie Gao  »View Author Affiliations

Chinese Optics Letters, Vol. 2, Issue 1, pp. 27-28 (2004)

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In order to measure spatially and temporarily resolved laser-produced plasma X-ray spectra in 0.2-2 nm region, a novel two-channel elliptically-bent crystal spectrograph has been developed. Dispersive elements are LiF, PET, Mica, and KAP crystals, which cover Bragg angles in the range of 30-67.5 degrees. Eccentricity and focal distance of twin ellipses are 0.9586 and 1350 mm, respectively. Spatially resolved spectrum is photographically recorded with an X-ray film or X-CCD camera in one channel, and temporarily resolved one is photographically recorded with an X-ray streak camera in another channel, thus spatially and temporarily resolved spectra can be simultaneously obtained. Spectral images were acquired with X-CCD and PET in SHENGUANG-II laser facility, and experimental results show that the spectral resolution of the spectrograph is about 0.002 nm.

© 2005 Chinese Optics Letters

OCIS Codes
(040.7480) Detectors : X-rays, soft x-rays, extreme ultraviolet (EUV)
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(350.5400) Other areas of optics : Plasmas

Xiancai Xiong, Xianxin Zhong, Shali Xiao, Guohong Yang, and Jie Gao, "Elliptically-bent crystal spectrograph for X-ray diagnosis of laser-produced plasmas," Chin. Opt. Lett. 2, 27-28 (2004)

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