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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 2, Iss. 10 — Oct. 10, 2004
  • pp: 611–614

Static recording characteristics of new type super-resolution near-field structure

Feng Zhang, Wendong Xu, Yang Wang, Jinsong Wei, Fei Zhou, Xiumin Gao, and Fuxi Gan  »View Author Affiliations


Chinese Optics Letters, Vol. 2, Issue 10, pp. 611-614 (2004)


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Abstract

A novel super-resolution near-field optical structure (super-RENS) with bismuth (Bi) mask layer is proposed in this paper. Static optical recording tests with and without super-RENS are carried out using a 650-nm semiconductor laser at recording powers of 14 and 7 mW with pulse duration of 100 ns. The recording marks are observed by high-resolution optical microscopy with a charge-coupled device (CCD) camera. The results show that the Bi mask layer can also concentrate energy into the center of a laser beam at low laser power similar to the traditional Sb mask layer. The results above are further confirmed by another Ar+ laser system. The third-order nonlinear response induced by the plasma oscillation at the Bi/SiN interface during laser irradiation can be used to explain the phenomenon. The calculation results are basically consistent with our experimental results.

© 2005 Chinese Optics Letters

OCIS Codes
(160.4330) Materials : Nonlinear optical materials
(210.0210) Optical data storage : Optical data storage
(310.0310) Thin films : Thin films

Citation
Feng Zhang, Wendong Xu, Yang Wang, Jinsong Wei, Fei Zhou, Xiumin Gao, and Fuxi Gan, "Static recording characteristics of new type super-resolution near-field structure," Chin. Opt. Lett. 2, 611-614 (2004)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-2-10-611


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References

  1. J. Tominaga, T. Nakano, and N. Atoda, Appl. Phys. Lett. 73, 2078 (1998).
  2. J. Li, H. Ruan, and F. Gan, Chin. J. Lasers (in Chinese) 29, 366 (2002).
  3. T. Fukaya, J. Tominaga, T. Nakano, and N. Atoda, Appl. Phys. Lett. 75, 3114 (1999).
  4. D. P. Tsai and W. C. Lin, Appl. Phys. Lett. 77, 1413 (2000).
  5. D. R. Ou, J. Zhu, and H. Zhao, Appl. Phys. Lett. 82, 1521 (2003).
  6. J. Wei and F. Gan, Appl. Phys. Lett. 82, 2607 (2003).
  7. Y. Liu, K. A. Mcgreer, B. Nease, D. B. Haviland, G. Martinez, J. W. Halley, and A. M. Geldman, Phys. Rev. Lett. 67, 2068 (1991).
  8. F. Y. Yang, K. Liu, K. Hong, D. H. Reich, P. C. Searson, and C. L. Chien, Science 284, 1335 (1999).
  9. E. I. Rogacheva, S. N. Grigorov, O. N. Nashchekina, S. Lyubchenko, and M. S. Dresselhaus, Appl. Phys. Lett. 82, 2628 (2003).
  10. E. R. Youngdale, J. R. Meyer, C. A. Hoffman, F. J. Bartoli, D. L. Partin, C. M. Thrush, and J. P. Heremans, Appl. Phys. Lett. 57, 336 (1990).
  11. Z. Pan, S. H. Morgan, D. O. Henderson, S. Y. Park, R. A. Weeks, R. H. Magruder, and R. A. Zuhr, Optical Materials 4, 675 (1995).
  12. D. R. Liu, K. S. Wu, M. F. Shih, and M. Y. Chern, Opt. Lett. 27, 1549 (2002).
  13. T. Missana and C. N. Afonso, Appl. Phys. A 62, 513 (1996).
  14. R. Atkinson and P. H. Lissberger, Thin Solid Films 7, 207 (1973).

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