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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 2, Iss. 11 — Nov. 10, 2004
  • pp: 640–642

Digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuit

Yuanhong Yang and Hongtao Yu  »View Author Affiliations


Chinese Optics Letters, Vol. 2, Issue 11, pp. 640-642 (2004)


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Abstract

A high-precision digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuits is proposed. This scheme is based on Sagnac interferometer modulated with digital step waveform whose frequency is half of eigen frequency of the interferometer. The technology and measuring precision are discussed. An experimental setup is made and the temperature-dependences of half-wave voltage of two samples are studied. Analysis and experimental study prove that this scheme is convenient and accurate.

© 2005 Chinese Optics Letters

OCIS Codes
(060.5060) Fiber optics and optical communications : Phase modulation
(120.5790) Instrumentation, measurement, and metrology : Sagnac effect
(130.3120) Integrated optics : Integrated optics devices

Citation
Yuanhong Yang and Hongtao Yu, "Digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuit," Chin. Opt. Lett. 2, 640-642 (2004)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-2-11-640

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