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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 3, Iss. S1 — Aug. 28, 2005
  • pp: S313–S315

Advantages of photon scanning tunneling microscope combined with atomic force microscope

Jian Zhang, Yinli Li, Gaoshu Jian, Ping Zhou, and Shifa Wu  »View Author Affiliations


Chinese Optics Letters, Vol. 3, Issue S1, pp. S313-S315 (2005)


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Abstract

A new nano-meter scale resolution optical imaging mode and functional prototype of photon scanning tunneling microscope (PSTM) combined with atomic force microscope (AFM) named as AF/PSTM are introduced, and the advantages of AF/PSTM are discussed. Two separated optical images (refractive index image and transmissivity image) and two AFM images (topography image and phase image) of sample can be obtained during AF/PSTM's once scanning. AF/PSTM is applicable to all transmission samples in many fields, such as nano-biology, medicine, nano-optics, nano-industry, nano-science and technology, high-education and so on.

© 2005 Chinese Optics Letters

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(170.0110) Medical optics and biotechnology : Imaging systems
(170.5810) Medical optics and biotechnology : Scanning microscopy
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
(240.7040) Optics at surfaces : Tunneling

Citation
Jian Zhang, Yinli Li, Gaoshu Jian, Ping Zhou, and Shifa Wu, "Advantages of photon scanning tunneling microscope combined with atomic force microscope," Chin. Opt. Lett. 3, S313-S315 (2005)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-3-S1-S313

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