OSA's Digital Library

Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 3, Iss. S1 — Aug. 28, 2005
  • pp: S313–S315

Advantages of photon scanning tunneling microscope combined with atomic force microscope

Jian Zhang, Yinli Li, Gaoshu Jian, Ping Zhou, and Shifa Wu  »View Author Affiliations


Chinese Optics Letters, Vol. 3, Issue S1, pp. S313-S315 (2005)


View Full Text Article

Acrobat PDF (547 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations
  • Export Citation/Save Click for help

Abstract

A new nano-meter scale resolution optical imaging mode and functional prototype of photon scanning tunneling microscope (PSTM) combined with atomic force microscope (AFM) named as AF/PSTM are introduced, and the advantages of AF/PSTM are discussed. Two separated optical images (refractive index image and transmissivity image) and two AFM images (topography image and phase image) of sample can be obtained during AF/PSTM's once scanning. AF/PSTM is applicable to all transmission samples in many fields, such as nano-biology, medicine, nano-optics, nano-industry, nano-science and technology, high-education and so on.

© 2005 Chinese Optics Letters

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(170.0110) Medical optics and biotechnology : Imaging systems
(170.5810) Medical optics and biotechnology : Scanning microscopy
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
(240.7040) Optics at surfaces : Tunneling

Citation
Jian Zhang, Yinli Li, Gaoshu Jian, Ping Zhou, and Shifa Wu, "Advantages of photon scanning tunneling microscope combined with atomic force microscope," Chin. Opt. Lett. 3, S313-S315 (2005)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-3-S1-S313


Sort:  Year  |  Journal  |  Reset

References

  1. G. Binnig and H. Rohrer, Helv. Phys. Acta. 55, 726 (1982).
  2. D. Pohl and D. Courjon (eds.), Near-Field Optics (NATO AST Series E242) (Kluwer, Dordrecht, 1983).
  3. D. Courjon and C. Bainier, Rep. Prog. Phys. 57, 989 (1984).
  4. C. Girard and A. Dereux, Rep. Prog. Phys. 59, 657 (1986).
  5. E. Betzig, P. L. Finn, and J. S. Weiner, Appl. Phys. Lett. 60, 2484 (1982).
  6. T. M. Ferrel, K. J. Warmarck, and R. C. Reddick, "Photon Scanning Tunneling Microscopy", Int. CI5: G01B11/24. United States, Patent number: 5,018,865 (1991).
  7. J. Yao, S. Wu, S. Gao, N. Guo, G. Shang, D. Xia, J. He, S. Chu, and C. Li, Electronic Microscope Transaction (in Chinese) 16, 222 (1997).
  8. S. Wu, J. Yao, G. Jian, and N. Guo, Acta Opt. Sin. (in Chinese) 18, 191 (1998).
  9. S. Wu, G. Jian, S. Pan, and Y. Wang, in Proceeding of 2nd Asia-Pacific Workshop on Near-Field Optics, 79 (2000).
  10. S. Wu, S. Pan, and G. Jian, Proc. SPIE 4098, 125 (2000).
  11. S. Wu, Scanning 17, 18 (1995).
  12. S. Wu, "The Separating Method of Photon Tunneling Scanning Image" (in Chinese), Chinese Patent ZL93 1 04111.2 (1999).
  13. S. Wu, "The Separating Method and Device of Photon Tunneling Scanning Image", Priority Japanese Patent, 3339658 (2002).
  14. S. Wu, "The Separating Method of Image of Atomic Force / Photon Scanning Tunneling Microscope" (in Chinese) Chinese Patent, ZL96 1 11979.9 (2002).
  15. G. Jian, S. Pan, and Y. Wang, Electronic Microscopy Transaction (in Chinese) 18, 13 (1999).
  16. X. Wang, G. Jian, W. Liu, S. Pan, and S. Wu, in Proceedings of 2nd Asia-Pacific Workshop on Near-Field Optics 123 (2000).
  17. S. Wu, G. Jian, and S. Pan, Proc. SPIE 3467, 34 (1998).
  18. C. Vannier and C. Bainier, Opt. Commun. 175, 83 (2000).
  19. S. Wu, S. Pan, J. Zhang, W. Liu, and J. Wang, Chin. Eng. Sci. 3, 33 (2001).
  20. S. Wu, J. Zhang, Y. Huang, Y. Li, W. Sun, and S. Pan, in Proceedings of 2002 Annual Meeting of China Optics 1, 245 (2002).
  21. S. Pan, S. Wu, W. Sun, Y. Li, Y. Zhang, and G. Jian, in Proceedings of 2002 Annual Meeting of China Optics 1, 240 (2002).
  22. S. Wu, G. Jian, and S. Pan, Acta Photon. Sin. (in Chinese) 27, 52 (1998).

Cited By

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited