AF/RSNOM is a new kind of scanning probe microscope developed in our lab, which is a combination of atomic force microscope and reflection scanning near field optical microscopy (AF/RSNOM) working in equi-amplitude tapping mode. This paper introduces the principle of AF/RSNOM and its advantages compared with other reflection mode scanning optical microscopes (RSNOM). Compared with the former RSNOM, this tapping mode AF/RSNOM has convenient operation and fewer background signals.
© 2005 Chinese Optics Letters
(110.0110) Imaging systems : Imaging systems
(110.0180) Imaging systems : Microscopy
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(180.0180) Microscopy : Microscopy
Yinli Li, Jian Zhang, Shifa Wu, Pengfei Li, and Shi Pan, "Comparison of AF/RSNOM with other RSNOM," Chin. Opt. Lett. 3, S316-S317 (2005)