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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 3, Iss. S1 — Aug. 28, 2005
  • pp: S316–S317

Comparison of AF/RSNOM with other RSNOM

Yinli Li, Jian Zhang, Shifa Wu, Pengfei Li, and Shi Pan  »View Author Affiliations


Chinese Optics Letters, Vol. 3, Issue S1, pp. S316-S317 (2005)


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Abstract

AF/RSNOM is a new kind of scanning probe microscope developed in our lab, which is a combination of atomic force microscope and reflection scanning near field optical microscopy (AF/RSNOM) working in equi-amplitude tapping mode. This paper introduces the principle of AF/RSNOM and its advantages compared with other reflection mode scanning optical microscopes (RSNOM). Compared with the former RSNOM, this tapping mode AF/RSNOM has convenient operation and fewer background signals.

© 2005 Chinese Optics Letters

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(110.0180) Imaging systems : Microscopy
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(180.0180) Microscopy : Microscopy

Citation
Yinli Li, Jian Zhang, Shifa Wu, Pengfei Li, and Shi Pan, "Comparison of AF/RSNOM with other RSNOM," Chin. Opt. Lett. 3, S316-S317 (2005)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-3-S1-S316

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