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Chinese Optics Letters

Chinese Optics Letters


  • Vol. 3, Iss. S1 — Aug. 28, 2005
  • pp: S318–S321

Temporal characteristic simulation for stimulated emission depletion microscopy

Wenxia Chen, Fanrong Xiao, Li Liu, and Guiying Wang  »View Author Affiliations

Chinese Optics Letters, Vol. 3, Issue S1, pp. S318-S321 (2005)

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The imaging technology of stimulated emission depletion (STED) utilizes the nonlinearity relationship between the fluorescence saturation and the excited state stimulated depletion. It implements three-dimensional (3D) imaging and breaks the diffraction barrier of far-field light microscopy by restricting fluorescent molecules at a sub-diffraction spot. In order to improve the resolution which attained by this technology, the computer simulation on temporal behavior of population probabilities of the sample was made in this paper, and the optimized parameters such as intensity, duration and delay time of the STED pulse were given.

© 2005 Chinese Optics Letters

OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.2520) Microscopy : Fluorescence microscopy
(180.6900) Microscopy : Three-dimensional microscopy
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(260.3060) Physical optics : Infrared

Wenxia Chen, Fanrong Xiao, Li Liu, and Guiying Wang, "Temporal characteristic simulation for stimulated emission depletion microscopy," Chin. Opt. Lett. 3, S318-S321 (2005)

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