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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 5, Iss. 11 — Nov. 10, 2007
  • pp: 680–682

Impact of organic contamination in vacuum on laser-induced damage threshold of TiO2/SiO2 dielectric mirrors

Yun Cui, Hua Yu, Yuanan Zhao, Yunxia Jin, Hongbo He, and Jianda Shao  »View Author Affiliations


Chinese Optics Letters, Vol. 5, Issue 11, pp. 680-682 (2007)


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Abstract

The influence of organic contamination in vacuum on the laser-induced damage threshold (LIDT) of coatings is studied. TiO2/SiO2 dielectric mirrors with high reflection at 1064 nm are deposited by the electronbeam evaporation method and their LIDTs are measured in vacuum and atmosphere, respectively. It is found that the contamination in vacuum is easily attracted to optical surfaces because of the low pressure and becomes the source of damage, O2 molecules in vacuum with contamination can accelerate the laser-induced damage by observing LIDT and damage morphologies. LIDTs of mirrors have a little change in vacuum compared with in atmosphere when the organic contamination is wiped off. The results indicate that organic contamination is a significant reason to decrease the LIDT in vacuum.

© 2007 Chinese Optics Letters

OCIS Codes
(140.0140) Lasers and laser optics : Lasers and laser optics
(140.3440) Lasers and laser optics : Laser-induced breakdown
(310.0310) Thin films : Thin films
(310.6870) Thin films : Thin films, other properties

Citation
Yun Cui, Hua Yu, Yuanan Zhao, Yunxia Jin, Hongbo He, and Jianda Shao, "Impact of organic contamination in vacuum on laser-induced damage threshold of TiO2/SiO2 dielectric mirrors," Chin. Opt. Lett. 5, 680-682 (2007)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-5-11-680


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References

  1. H. A. Abdeldayem, E. Dowdye, J. Canham, and T. Taeger, Proc. SPIE 5897, 589705 (2005).
  2. P. Allenspacher, W. Riede, D. Wernham, A. Capanni, and F. Era, Proc. SPIE 5991, 599128 (2005).
  3. W. Riede and P. Allenspacher, in Proceeding of the 5th ICSO 2004 839 (2004).
  4. C. Scurlock, Proc. SPIE 5647, 86 (2005).
  5. ISO 11254-1, Determination of Laser Induced Damage Threshold of Optical Surfaces-Part 1: 1-on-1 Test (2000).
  6. Laser-Induced Damage Threshold and Certification Procedures for Optical Materials (NASA RP-1395, 1997).

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