Improving contrast and sectioning power in confocal imaging by third harmonic generation in SiOx nanocrystallites
Chinese Optics Letters, Vol. 5, Issue 8, pp. 477-479 (2007)
Acrobat PDF (149 KB)
Abstract
We present a new optical microscope in which the light transmitted by a sample-scanned transmission confocal microscope is frequency-tripled by SiOx nanocrystallites in lieu of being transmitted by a confocal pinhole. This imaging technique offers an increased contrast and a high scattered light rejection. It is demonstrated that the contrast close to the Sparrow resolution limit is enhanced and the sectioning power are increased with respect to the linear confocal detection mode. An experimental implementation is presented and compared with the conventional linear confocal mode.
© 2007 Chinese Optics Letters
OCIS Codes
(110.0110) Imaging systems : Imaging systems
(110.6880) Imaging systems : Three-dimensional image acquisition
(180.0180) Microscopy : Microscopy
(180.1790) Microscopy : Confocal microscopy
Citation
Gilbert Boyer and Karsten Plamann, "Improving contrast and sectioning power in confocal imaging by third harmonic generation in SiOx nanocrystallites," Chin. Opt. Lett. 5, 477-479 (2007)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-5-8-477
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Electromagnetic degrees of freedom of an optical system (JOSAA)
- Generalized confocal imaging and synthetic aperture imaging (JOSAA)
- Method of obtaining optical sectioning by using structured light in a conventional microscope (OL)
- Implementation of Multilens Micro-optical Systems with Large Numerical Aperture by Stacking of Microlenses (AO)
- Effect of Scattering on Nonlinear Optical Scanning Microscopy Imaging of highly scattering media (AO)
« Previous Article | Next Article »
OSA is a member of 