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Optica Publishing Group
  • Chinese Optics Letters
  • Vol. 5,
  • Issue 9,
  • pp. 501-503
  • (2007)

Characterization of planar photonic crystals using surface coupling techniques at large wavelengths

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Abstract

We report a non-destructive characterization of planar two-dimensional (2D) photonic crystals (PhCs) made in silicon on insulator (SOI) wafers using ellipsometric or Fourier transformed infrared (FTIR) spectroscope. At large wavelengths, devices behave as homogeneous isotropic materials defined by an effective filling factor. The experimental results related to the PhC limited dimensions confirm this characterization.

© 2007 Chinese Optics Letters

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