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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 6, Iss. 1 — Jan. 10, 2008
  • pp: 32–34

Relationship between normalized light intensity and attenuated total reflection ratio

Yingcai Wu and Zhengtian Gu  »View Author Affiliations


Chinese Optics Letters, Vol. 6, Issue 1, pp. 32-34 (2008)


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Abstract

Attenuated total reflection (ATR) ratio is usually utilized to study the properties of surface plasmon resonance (SPR) sensors. The relationship between normalized light intensity and ATR ratio is investigated, and a modification coefficient is put forward to describe the relationship. A mathematical expression is built up for the coefficient based on Fresnel principle. The result shows that the ATR ratio, which cannot be measured directly in experiments, can be determined with the coefficient and the normalized intensity of light. The characteristic of the coefficient is also discussed.

© 2008 Chinese Optics Letters

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(130.6010) Integrated optics : Sensors
(230.0230) Optical devices : Optical devices

Citation
Yingcai Wu and Zhengtian Gu, "Relationship between normalized light intensity and attenuated total reflection ratio," Chin. Opt. Lett. 6, 32-34 (2008)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-6-1-32

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