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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 6, Iss. 1 — Jan. 10, 2008
  • pp: 57–60

Realization of absolute negative refraction index by a photonic crystal using anisotropic dielectric material

Yuntuan Fang and Zhengbiao Ouyang  »View Author Affiliations


Chinese Optics Letters, Vol. 6, Issue 1, pp. 57-60 (2008)


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Abstract

A method to realize absolute negative refraction index [EQUATION] with a two-dimensional (2D) photonic crystal is presented by introducing dielectric anisotropy in the photonic crystal material. The band structures of E-polarization mode and H-polarization mode can be adjusted by changing the parameters of materials. Thus the two modes with different polarizations have the same negative refraction index [EQUATION] for the same frequency. The results are demonstrated by numerical simulation based on the finite-difference time-domain (FDTD) method.

© 2008 Chinese Optics Letters

OCIS Codes
(110.2990) Imaging systems : Image formation theory
(160.4670) Materials : Optical materials
(250.0250) Optoelectronics : Optoelectronics
(260.1180) Physical optics : Crystal optics

Citation
Yuntuan Fang and Zhengbiao Ouyang, "Realization of absolute negative refraction index by a photonic crystal using anisotropic dielectric material," Chin. Opt. Lett. 6, 57-60 (2008)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-6-1-57

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