OSA's Digital Library

Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 7, Iss. 1 — Jan. 1, 2009
  • pp: 88–91

Measurement of bidirectional reflection distribution function on material surface

Wei Zhang, Hongyuan Wang, and Zhile Wang  »View Author Affiliations


Chinese Optics Letters, Vol. 7, Issue 1, pp. 88-91 (2009)


View Full Text Article

Acrobat PDF (3433 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations
  • Export Citation/Save Click for help

Abstract

Two automatic measurement methods of bidirectional reflection distribution function (BRDF) are presented based on absolute and relative definition. Measurement principle and scheme of the methods are analyzed. A real-time measurement device is developed, the measurement spectral range of which is from ultraviolet to near infrared with 2.4-nm wavelength resolution, and the angular range is [EQUATION] in azimuth angle and [EQUATION] in zenith angle with [EQUATION] angle resolution. Absolute measurements of BRDF on tinfoil and ceramic tile are performed and the test materials present apparent specular reflection characteristics. The theoretical error in the experiment is about 6.05%. The BRDF measurement results are closely related to the precision of measurement platform, the sensitivity of measurement instrument, and the stability of illuminating light source.

© 2009 Chinese Optics Letters

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(160.4760) Materials : Optical properties
(290.5820) Scattering : Scattering measurements
(300.6550) Spectroscopy : Spectroscopy, visible

Citation
Wei Zhang, Hongyuan Wang, and Zhile Wang, "Measurement of bidirectional reflection distribution function on material surface," Chin. Opt. Lett. 7, 88-91 (2009)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-7-1-88


Sort:  Author  |  Year  |  Journal  |  Reset

References

  1. H. Wang, W. Zhang, and Z. Wang, Acta Opt. Sin. (in Chinese) 28, 593 (2008).
  2. R. Yang, M. Wan, and D. Lu, Chinese J. Lasers (in Chinese) 33, (Suppl.) 260 (2006).
  3. L. Yang and J. Han, Chin. Opt. Lett. 5, 204 (2007).
  4. P. Poulin and A. Fournier, Comput. Graph. 24, 273 (1990).
  5. G. J. Ward, Comput. Graph. 26, 265 (1992).
  6. Y. Boucher, H. Cosnefroy, A. D. Petit, G. Serrot, and X. Briottet, Proc. SPIE 3699, 16 (1999).
  7. A. Ryer, The Light Measurement Handbook (International Light, Newburyport, 1998) p.1.
  8. C. Qi, C. Yang, W. Li, and J. Dai, Chin. Opt. Lett. 1, 398 (2003).
  9. Z. Zhao, C. Qi, and J. Dai, Chin. Opt. Lett. 5, 168 (2007).
  10. S. C. Foo, "A gonioreflectometer for measuring the bidirectional reflectance of material for use in illumination computation" (Master's Thesis, Cornell University, 1997) p.1.
  11. L. Ke, "A method of light reflectance measurement" (Master's Thesis, University of British Columbia, 1999) p.1.

Cited By

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited