A novel atomic force microscope operating in liquid with open probe unit and optimized laser tracking system
Chinese Optics Letters, Vol. 7, Issue 10, pp. 891-893 (2009)
Acrobat PDF (791 KB)
Abstract
A novel atomic force microscope (AFM) for large samples to be measured in liquid is developed. An innovative laser beam tracking system is proposed to eliminate the tracking and feedback errors. The open probe design of the AFM makes the operation in liquid convenient and easy. A standard 1200-lines/mm grating and a sheet of filter paper are imaged respectively in air and liquid to confirm its performance. The corrosion behavior of aluminum surface in 1-mol/L NaOH solution is further investigated by the AFM. Experimental results show that the system can realize wide range (20 20 (\mu m)) scanning for large samples both in air and liquid, while keeping nanometer order resolution in liquid by eliminating the tracking and feedback error.
© 2009 Chinese Optics Letters
OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
Citation
Xia Fu, Dongxian Zhang, and Haijun Zhang, "A novel atomic force microscope operating in liquid with open probe unit and optimized laser tracking system," Chin. Opt. Lett. 7, 891-893 (2009)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-7-10-891
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Optical Contrast in Apertureless Microscopy (AO)
- Observation and analysis of near-field optical diffraction (JOSAA)
- Computer-controlled optical scanning tile microscope (AO)
- Scanned-cantilever atomic force microscope with large scanning range (COL)
- Parametric uncertainty in nanoscale optical dimensional measurements (AO)
Related Conference Papers
- Femtosecond High-Brightness Nanometer-Sized Coherent Light Source
- Fast-Scanning Two-Photon Fluorescence Imaging Using a Microelectromechanical Systems (MEMS) Two-Dimensional Scanning Mirror
- Arbitrary Focal-Field Polarization Control for Optical Microscopy
- Plasmon-Resonant Field Enhancement Metallic Tip-Substrate Systems
- Arbitrary Focal-Field Polarization Control for Optical Microscopy
« Previous Article | Next Article »
OSA is a member of 