Study of X-ray Kirkpatrick-Baez imaging with single layer
Chinese Optics Letters, Vol. 7, Issue 5, pp. 452-454 (2009)
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Abstract
The X-ray Kirkpatrick-Baez (KB) imaging experiment with single layer is implemented. Based on the astigmatism aberration and residual geometric aberration of a single mirror, a KB system with 16X mean magnification and approximately 0.45\circ razing incidence angle is designed. The mirrors are deposited with an Ir layer of 20-nm thickness. Au grids backlit by X-ray tube of 8 keV are imaged via the KB system on scintillator charge-coupled device (CCD). In the \pm80 \mum field, resolutions of less than 5 \mum are measured. The result is in good agreement with the simulated imaging.
© 2009 Chinese Optics Letters
OCIS Codes
(340.7440) X-ray optics : X-ray imaging
(340.7460) X-ray optics : X-ray microscopy
(340.7470) X-ray optics : X-ray mirrors
(310.6845) Thin films : Thin film devices and applications
Citation
Baozhong Mu, Zhanshan Wang, Shengzhen Yi, Xin Wang, Shengling Huang, Jingtao Zhu, and Chengchao Huang, "Study of X-ray Kirkpatrick-Baez imaging with single layer," Chin. Opt. Lett. 7, 452-454 (2009)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-7-5-452
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