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Chinese Optics Letters

Chinese Optics Letters


  • Vol. 7, Iss. 5 — May. 1, 2009
  • pp: 452–454

Study of X-ray Kirkpatrick-Baez imaging with single layer

Baozhong Mu, Zhanshan Wang, Shengzhen Yi, Xin Wang, Shengling Huang, Jingtao Zhu, and Chengchao Huang  »View Author Affiliations

Chinese Optics Letters, Vol. 7, Issue 5, pp. 452-454 (2009)

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The X-ray Kirkpatrick-Baez (KB) imaging experiment with single layer is implemented. Based on the astigmatism aberration and residual geometric aberration of a single mirror, a KB system with 16X mean magnification and approximately 0.45\circ razing incidence angle is designed. The mirrors are deposited with an Ir layer of 20-nm thickness. Au grids backlit by X-ray tube of 8 keV are imaged via the KB system on scintillator charge-coupled device (CCD). In the \pm80 \mum field, resolutions of less than 5 \mum are measured. The result is in good agreement with the simulated imaging.

© 2009 Chinese Optics Letters

OCIS Codes
(340.7440) X-ray optics : X-ray imaging
(340.7460) X-ray optics : X-ray microscopy
(340.7470) X-ray optics : X-ray mirrors
(310.6845) Thin films : Thin film devices and applications

Baozhong Mu, Zhanshan Wang, Shengzhen Yi, Xin Wang, Shengling Huang, Jingtao Zhu, and Chengchao Huang, "Study of X-ray Kirkpatrick-Baez imaging with single layer," Chin. Opt. Lett. 7, 452-454 (2009)

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