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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 7, Iss. 7 — Jul. 1, 2009
  • pp: 585–589

Experimental study on electrical resistivity measurement of a specimen at high temperature

Chunsuo Xin, Jingmin Dai, and Xiaowa He  »View Author Affiliations


Chinese Optics Letters, Vol. 7, Issue 7, pp. 585-589 (2009)


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Abstract

A new technique is developed to measure the electrical resistivity of conductor with a nonuniform temperature profile. The calculation method is derived from the temperature dependence of the electrical resistivity. The apparatus consists mainly of a high temperature environmental chamber, a power circuit of heating, a twenty-wavelength pyrometer, and a scanning pyrometer. After getting the resistance from the voltage drop of the specimen, the electrical resistivity in a wide temperature range of the specimen can be obtained by our calculation model. Preliminary results of the electrical resistivity of SRM 8424 over a wide temperature range (1000-3000 K) are presented. The perfect consistency between the measurement results and the nominal values justifies the validity of this technique.

© 2009 Chinese Optics Letters

OCIS Codes
(000.6850) General : Thermodynamics
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.6780) Instrumentation, measurement, and metrology : Temperature

Citation
Chunsuo Xin, Jingmin Dai, and Xiaowa He, "Experimental study on electrical resistivity measurement of a specimen at high temperature," Chin. Opt. Lett. 7, 585-589 (2009)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-7-7-585

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