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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 7, Iss. 7 — Jul. 1, 2009
  • pp: 624–626

Using modified Mach-Zehnder interferometer to get better nonlinear correction term of an isotropic nonlinear material

Ashish Pal and Sourangshu Mukhopadhyay  »View Author Affiliations


Chinese Optics Letters, Vol. 7, Issue 7, pp. 624-626 (2009)


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Abstract

Nonlinear materials have been well established as photo refractive switching material. Important applications of isotropic nonlinear materials are seen in self-focusing, defocusing phenomena, switching systems, etc. The nonlinear correction term is basically responsible for the optical switches. Mach-Zehnder interferometer (MZI) is a well-known arrangement for determining the above correction term, but there are some major problems for finding out the term by MZI. We propose a new method of finding the nonlinear correction term as well as the second order nonlinear susceptibility of the materials by using a modified MZI system. This method may be used to find out the above parameters for any unknown nonlinear material.

© 2009 Chinese Optics Letters

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(200.0200) Optics in computing : Optics in computing

Citation
Ashish Pal and Sourangshu Mukhopadhyay, "Using modified Mach-Zehnder interferometer to get better nonlinear correction term of an isotropic nonlinear material," Chin. Opt. Lett. 7, 624-626 (2009)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-7-7-624


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