OSA's Digital Library

Chinese Optics Letters

Chinese Optics Letters


  • Vol. 8, Iss. 1 — Jan. 1, 2010
  • pp: 99–102

Fabrication and measurement of optical characterization of one dimensional photonic crystal with defect

Kai Tong, Fei Wu, and Zhibin Wang  »View Author Affiliations

Chinese Optics Letters, Vol. 8, Issue 1, pp. 99-102 (2010)

View Full Text Article

Acrobat PDF (648 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

  • Export Citation/Save Click for help


Numerical calculations based on the transfer matrix method are carried out, and the results of band gap with resonance peaks are obtained. The electron beam lithography technology (EBL) and induction coupling plasma (ICP) etching are used to make the photonic crystal (PC) structures, and from several scanning electron microscope images, the PC structures are observed with features closing to the design. In order to create the tiny PC structures in the right places of the waveguide by the EBL technology at different time, some alignment markers are deposited on the chip, which are made of gold that deposited on titanium for its good adhesion to the underlying Si. An optical testing bed is designed for measurement of the optical characterization of PC structures. Through the analysis of the measured data, \Delta \lambda value of 0.8 nm is obtained and for the centre frequency of 1547 nm, a very high quality factor value of 1933 can be obtained. The 3-nm difference represents only a 0.2% error from the theoretical centre.

© 2010 Chinese Optics Letters

OCIS Codes
(220.0220) Optical design and fabrication : Optical design and fabrication
(260.0260) Physical optics : Physical optics
(310.0310) Thin films : Thin films

Kai Tong, Fei Wu, and Zhibin Wang, "Fabrication and measurement of optical characterization of one dimensional photonic crystal with defect," Chin. Opt. Lett. 8, 99-102 (2010)

Sort:  Author  |  Year  |  Journal  |  Reset


  1. Y. Benachour and N. Paraire, Chin. Opt. Lett. 5, 501 (2007).
  2. O. N. Kozina and L. A. Melnikov, J. Non-Cryst. Solids 353, 968 (2007).
  3. E. Galindo-Linares, P. Halevi, and A. S. Sanchez, Solid State Commun. 142, 67 (2007).
  4. W. L. Vos, R. Sprik, A. van Blaaderen, A. Imhof, A. Lagendijk, and G. H. Wegdam, Phys. Rev. B 53, 16231 (1996).
  5. I. I. Tarhan and G. H. Watson, Phys. Rev. Lett. 76, 315 (1996).
  6. T. M. Miller, H. Fang, R. H. Magruder III, and R. A. Weller, Sensors and Actuators A 104, 162 (2003).
  7. S. Gupta, G. Tuttle, M. Sigalas, and K.-M. Ho, Appl. Phys. Lett. 71, 2412 (1997).
  8. A. Ferrando and J. J. Miret, Appl. Phy. Lett. 78, 3184 (2001).
  9. T. Prasad, D. M. Mittleman, and V. L. Colvin, Opt. Mater. 29, 56 (2006).
  10. L. Tang, L. Gao, and J. Fang, Chin. Opt. Lett. 6, 201 (2008).
  11. Z. Li, T. Shen, X. Song, J. Ma, Y. Sheng, and G. Wang, Chin. Opt. Lett. 5, 696 (2007).

Cited By

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited