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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 8, Iss. 2 — Feb. 1, 2010
  • pp: 181–183

Qualification of superpolished substrates for laser-gyro by surface integrated scatter measurement

Zhimeng Wei, Xingwu Long, and Kaiyong Yang  »View Author Affiliations


Chinese Optics Letters, Vol. 8, Issue 2, pp. 181-183 (2010)


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Abstract

Integrated scatterometer for qualification of superpolished substrates for laser-gyro by surface scatter loss measurement is constructed. Different from the qualification of substrate by surface roughness, the scatterometer measures the forward surface scatter loss to check whether the mirror made of the substrate will be suitable for the required laser-gyro lock-in specification. The scatterometer utilizes convex lens instead of integrating sphere to collect scatter light. Special sample support and baffle are designed to block unwanted light. The result of stability test is given, which is about 0.4% over 10 h.

© 2010 Chinese Optics Letters

OCIS Codes
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(310.3840) Thin films : Materials and process characterization
(290.2558) Scattering : Forward scattering

Citation
Zhimeng Wei, Xingwu Long, and Kaiyong Yang, "Qualification of superpolished substrates for laser-gyro by surface integrated scatter measurement," Chin. Opt. Lett. 8, 181-183 (2010)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-8-2-181


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References

  1. F. Aronowitz, The Laser Gyro in Laser Application (Academic Press, New York, 1971).
  2. D. R. Schmitt, Proc. SPIE 1009, 155 (1988).
  3. J. M. Bennett and L. Mattsson, Introduction to Surface Roughness and Scattering (OSA, Washington, D. C, 1999).
  4. J. C. Stover, Optical Scattering: Measurement and Analysis (Mcgraw-Hiu Press, New York, 1990).
  5. "Test methods for radiation scattered by optical components" (ISO13696, 2002).
  6. A. Hultaker, S. Gliech, N. Benkert, and A. Duparre, Proc. SPIE 5188, 115 (2003).
  7. K. D. Skeldon, J. Mackintosh, M. Gradowski, S. Thieux, and R. Lee, J. Opt. A 3, 183 (2001).

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