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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 8, Iss. 3 — Mar. 1, 2010
  • pp: 313–315

Local magneto-optical Kerr effect imaging by scanning near-field optical microscope in reflection-mode

Wei Cai, Guangyi Shang, and Jun'en Yao  »View Author Affiliations


Chinese Optics Letters, Vol. 8, Issue 3, pp. 313-315 (2010)


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Abstract

A method for local magneto-optical Kerr effect imaging based on a home-made scanning near-field optical microscope working in reflection mode is presented. Shear force detection is carried out by using a symmetric piezoelectric bimorph sensor, which provides an easy way not only for probe-surface distance control but also for imaging. Polarization-preserving fiber probes used as a local optical detector are fabricated with a heating-pulling technique and the probes' polarization properties are measured. Shear force topographic and near-field magneto-optical images of magneto-optical disk taken with the proposed method are shown.

© 2010 Chinese Optics Letters

OCIS Codes
(190.3270) Nonlinear optics : Kerr effect
(210.3810) Optical data storage : Magneto-optic systems
(180.4243) Microscopy : Near-field microscopy

Citation
Wei Cai, Guangyi Shang, and Jun'en Yao, "Local magneto-optical Kerr effect imaging by scanning near-field optical microscope in reflection-mode," Chin. Opt. Lett. 8, 313-315 (2010)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-8-3-313


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