A guided-mode resonance (GMR) filter with the same material (Ta2O5) for both the grating layer and the waveguide layer is designed and fabricated. This simple structure is easy to fabricate and can avoid the defects at the grating/waveguide interface using different materials. The spectral response measured with a Lambda 900 spectrophotometer under normal incidence for TE waves exhibits a peak reflectance exceeding 80% at the wavelength of 1040 nm with a full-width half-maximum (FWHM) linewidth of 23 nm. We evaluate the deviations of the fabricated structure from the designed parameters.
© 2010 Chinese Optics Letters
(050.1950) Diffraction and gratings : Diffraction gratings
(310.2790) Thin films : Guided waves
(310.6860) Thin films : Thin films, optical properties
(230.7408) Optical devices : Wavelength filtering devices
Tianyu Sun, Jianyong Ma, Xiaoyong Fu, Jianpeng Wang, Yunxia Jin, Jianda Shao, and Zhengxiu Fan, "Single-material guided-mode resonance filter for TE waves under normal incidence," Chin. Opt. Lett. 8, 447-448 (2010)