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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 8, Iss. 7 — Jul. 1, 2010
  • pp: 666–669

Measuring method for micro-diameter based on structured-light vision technology

Bin Liu, Peng Wang, Yong Zeng, and Changku Sun  »View Author Affiliations


Chinese Optics Letters, Vol. 8, Issue 7, pp. 666-669 (2010)


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Abstract

Based on structured-light vision measurement technology, we study a measuring method for microdiameter. The measurement principle and mathematical model are described. A novel grayscale barycenter extraction algorithm along the radial direction is proposed, which can precisely gather the image coordinates of the ellipse-shaped light-stripe centers. The accuracy of the measurement result shows marked improvement by using the algorithm. The method executes circle fitting to the measured three-dimensional (3D) data using linear least square method, which can acquire the diameter, surface profile, and other information of the object effectively. On the scene, a line-structured light vision system using the presented method is applied to measure the curvature radius of metal blades. Experimental results show that the measurement precision of the system is higher than 2 \mu m.

© 2010 Chinese Optics Letters

OCIS Codes
(150.6910) Machine vision : Three-dimensional sensing
(150.0155) Machine vision : Machine vision optics
(150.1135) Machine vision : Algorithms

Citation
Bin Liu, Peng Wang, Yong Zeng, and Changku Sun, "Measuring method for micro-diameter based on structured-light vision technology," Chin. Opt. Lett. 8, 666-669 (2010)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-8-7-666


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References

  1. Z. Liu, G. Zhang, Z. Wei, and J. Jiang, Acta Opt. Sin. (in Chinese) 29, 3124 (2009).
  2. G. Sansoni, S. Lazzari, S. Peli, and F. Docchio, in IEEE Proceedings of International Conference on Recent Advances in 3-D Digital and Modeling 19 (1997).
  3. C. Sun, B. Liu, and P. Wang, J. Vacuum Sci. Technol. B: Microelectron. Nanometer Structures 27, 1315 (2009).
  4. Q. Wu, J. Li, X. Su, and B. Hui, Chinese J. Lasers (in Chinese) 35, 1224 (2008).
  5. M. Tsai and C. Hung, J. International Measurement Confederation 38, 236 (2005).
  6. R. Y. Tsai, IEEE J. Robotics and Automation 3, 323 (1987).
  7. K. Hu, F. Zhou, and G. Zhang, Chin. J. Scientific Instrument (in Chinese) 27, 1326 (2006).
  8. C. Steger, IEEE Trans. Pattern Analysis and Machine Intelligence 20, 113 (1998).
  9. P. Wang, "Study on key techniques for automatic 3D structured-light scanning system" (in Chinese) PhD. Thesis (Tianjin University, 2009).
  10. A. W. Fitzgibbon, M. Pilu, and R. B. Fisher, IEEE Trans. Pattern Analysis and Machine Intelligence 21, 476 (1999).
  11. K. Peng, S. Liu, X. Zhang, and F. Huang, OptoElectron. Eng. (in Chinese) 33, 101 (2006).
  12. W. Gander, G. H. Golub, and R. Strebel, BIT Numerical Mathematics 34, 558 (1994).
  13. K. Liu, F. Zhou, and G. Zhang, J. Optoelectron. Lasers (in Chinese) 17, 604 (2006).
  14. G. Peng and X. Chen, J. Geodesy and Geodynamics (in Chinese) 28, 92 (2008).

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