Reflective point-dif fraction microscopic interferometer with long-term stability (Invited Paper)
Chinese Optics Letters, Vol. 9, Issue 12, pp. 120002- (2011)
Acrobat PDF (812 KB)
Abstract
An on-axis phase-shifting reflective point-diffraction microscopic interferometer for quantitative phase microscopy based on Michelson architecture is proposed. A cube beamsplitter splits the object wave spectrum into two copies within two arms. Reference wave is rebuilt in one arm by low-pass filtering on the object wave frequency spectrum with a pinhole-mask mirror, and interferes with the object wave from the other arm. Polarization phase-shifting is performed and phase imaging on microscale specimens is implemented. The experimental results demonstrate that the proposed scheme has the advantage of long-term stability due to its quasi common-path geometry with full use of laser energy.
© 2011 Chinese Optics Letters
OCIS Codes
(090.2880) Holography : Holographic interferometry
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.3170) Microscopy : Interference microscopy
ToC Category:
Measurement
Virtual Issues
Digital Holography and 3D Imaging 2011 (2011) Applied Optics
Citation
Rongli Guo, Baoli Yao, Peng Gao, Junwei Min, Juanjuan Zheng, and Tong Ye, "Reflective point-dif fraction microscopic interferometer with long-term stability
(Invited Paper)," Chin. Opt. Lett. 9, 120002- (2011)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-9-12-120002
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