Abstract
We present a spiral phase filtering system with a large tolerance for edge
enhancement of both phase and amplitude objects in optical microscopy. The method is
based on a Fourier 4-f spatial filtering system. A phase mismatched spiral phase
plate (SPP) fabricated by electron beam lithography is employed as the radial
Hilbert transform for image edge enhancement. Compared with holography, SPP is
simple, economical, reliable, and easy to integrate.
© 2011 Chinese Optics Letters
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