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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

  • Vol. 9, Iss. 7 — Jul. 10, 2011
  • pp: 070401–070401

Intensifying process of polarization ef fect within pixellated CdZnTe detectors for X-ray imaging

Xi Wang, Shali Xiao, Miao Li, Liuqiang Zhang, Yulin Cao, and Yuxiao Chen  »View Author Affiliations


Chinese Optics Letters, Vol. 9, Issue 7, pp. 070401-070401 (2011)


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Abstract

The intensifying process of polarization effect at room temperature in a pixellated Cadmium zinc telluride (CdZnTe) monolithic detector is studied. The process is attributed to the increase in build up space charges in the CdZnTe crystal, which causes an expansion of the space charge region under the irradiated area. The simulations of electric potential distributions indicate that the distorted electric potential due to the high X-ray flux is significantly changed and even deteriorated due to increasing space charges within the irradiated volume. An agreement between the space charge distribution and electric potential is discussed.

© 2011 Chinese Optics Letters

OCIS Codes
(040.1880) Detectors : Detection
(160.6000) Materials : Semiconductor materials
(230.0040) Optical devices : Detectors
(340.7440) X-ray optics : X-ray imaging

Citation
Xi Wang, Shali Xiao, Miao Li, Liuqiang Zhang, Yulin Cao, and Yuxiao Chen, "Intensifying process of polarization ef fect within pixellated CdZnTe detectors for X-ray imaging," Chin. Opt. Lett. 9, 070401-070401 (2011)
http://www.opticsinfobase.org/col/abstract.cfm?URI=col-9-7-070401


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