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Chinese Optics Letters

Chinese Optics Letters

| PUBLISHED MONTHLY BY CHINESE LASER PRESS AND DISTRIBUTED BY OSA

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About Chinese Optics Letters

Chinese Optics Letters (COL) is an international journal aimed at the rapid dissemination of latest, important discoveries and inventions in all branches of optical science and technology. It is considered to be one of the most important journals in optics in China. It is collected by the Optics InfoBase of the Optical Society (OSA) and also indexed by Science Citation Index (SCI), Engineering Index (EI), etc. COL is distinguished by its short review period (~30 days) and publication period (~100 days).

With its debut in January 2003, COL is published monthly by Chinese Laser Press, and distributed by OSA outside of Chinese Mainland.

Sponsor

The journal is sponsored by the Chinese Optical Society (COS) and Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences. Their information can be found on the websites: www.cncos.org and www.siom.cas.cn, respectively.

Editorial Board

Editor-in-Chief

Zhizhan Xu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China

Executive Editor-in-Chief

Changhe Zhou, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China

Associate Editors-in-Chief

See Leang Chin, University Laval, Canada
Xianfeng Chen, Shanghai Jiao Tong University, China
Qihuang Gong, Peking University, China
Joseph W. Haus, University of Dayton, USA
Ruxin Li, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Ting-Chung Poon, Virginia Tech, USA
Xi-Cheng Zhang, University of Rochester, USA

Advisory Editors

Joseph H. Eberly, University of Rochester, USA
Fuxi Gan, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Yuen-Ron Shen, University of California, USA
Zhijiang Wang, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Bingkun Zhou, Tsinghua University, China

Editorial Board

George Barbastathis, University of Massachusetts, USA
Yves Bellouard, Eindhoven University of Technology, The Netherlands
Xuzong Chen, Peking University, China
Junhao Chu, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, China
Yujie J. Ding, Lehigh University, USA
Daniel Elson, Imperil College London, UK
Bruce Z. Gao, Clemson University, USA
Min Gu, Swinburne University of Technology, Australia
Guangcan Guo, University of Science and Technology of China, China
Sailing He, Royal Institute of Technology, Sweden
Xun Hou, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, China
Weisheng Hu*, Shanghai Jiao Tong University, China
Guoxiang Huang, East China Normal University, China
Jürgen Jahns, Fern University in Hagen, Germany
Shibin Jiang, University of Arizona, USA
Wei Jin, The Hong Kong Polytechnic University, China
Jin U. Kang, Johns Hopkins University, USA
Takayoshi Kobayashi, The University of Electro-Communications, Japan
Guifang Li*, University of Central Florida, USA
Janlang Li*, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Jiao Lin*, University of Melbourne, Australia
Chao Lu*, The Hong Kong Polytechnic University, China
Yanqing Lu, Nanjing University, China
Qingming Luo, Huazhong University of Science & Technology, China
Jean-Michel Nunzi*, Queen's University, Canada
Wolfgang Osten, Universität Stuttgart, Germany
Li Qian*, University of Toronto, Canada
Fabian Rotermund*, Ajou University, Korea
Mengyan Shen, University of Massachusetts, USA
Yunlong Sheng, University Laval, Canada
Ephraim Suhir*, University of California, USA
Limin Tong, Zhejiang University, China
Cesare Umeton, University of Calabria, Italy
Haifeng Wang*, University of Shanghai for Science & Technology, China
Huitian Wang*, Nankai University, China
Zhiyi Wei, Institute of Physics, Chinese Academy of Sciences, China
Shusen Xie, Fujian Normal University, China
Lei Xu*, Fudan University, China
Xianfan Xu, Purdue University, USA
Xiaocong Yuan*, Shenzhen University,China
Jie Zhang, Shanghai Jiao Tong University, China
Shuang Zhang, University of Birmingham, UK
Weili Zhang*, Oklahoma State University, USA
Jianqiang Zhu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Xiaolei Zhu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
*also serve as Topical Editors

Topical Editors

Shangqing Gong, East China University of Science and Technology, China
Yuansheng Wang, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, China
Peng Xi, Peking University, China
Sihua Yang, South China Normal University, China

Assistant Editors

Liwei Hua, Missouri University of Science and Technology, USA
Fang Liu, European Molecular Biology Laboratory, Germany
Yan Zhang, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China

Manuscript Office

Shanghai Institute of Optics and Fine Mechanics,
Chinese Academy of Sciences,
390 Qinghe Rd., Jiading,
P. O. Box 800-211,
201800, Shanghai, China
E-mail: col@siom.ac.cn
Tel: 0086-21-69918428
Fax: 0086-21-69918705

Copy Editors

Xiaofeng Wang, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
E-mail: wxf@siom.ac.cn
Yanfang Hu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
E-mail: huyanfang@siom.ac.cn
Jie Ding, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
E-mail: dingjie@siom.ac.cn
Shengling Liu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
E-mail: slliu@siom.ac.cn
Zhilan Li, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
E-mail: zhilanli@siom.ac.cn
Xini Yuan, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
E-mail: xini.yuan@siom.ac.cn
Ran Zhang, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
E-mail: zhangran@siom.ac.cn





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